TELKOM
NIKA Indonesia
n
Journal of
Electrical En
gineering
Vol.12, No.7, July 201
4, pp
. 4944 ~ 49
5
3
DOI: 10.115
9
1
/telkomni
ka.
v
12i7.432
1
4944
Re
cei
v
ed Se
ptem
ber 3, 2013; Re
vi
sed
Febr
uary 21,
2014; Accept
ed March 8, 2
014
Study on the Acceptan
ce Test Specification of Grid-
connected Micr
o-grid
Le Jian
1
, Mao Tao
1
, Yang Zhichun
2
, Liu Yang
1
, Liu
Kaipei
1
1
School of Elec
trical Eng
i
ne
eri
ng, W
uhan U
n
i
v
ersit
y
, W
u
h
a
n
,
43007
2, Chi
n
a
2
Hube
i Electric
Po
w
e
r R
e
sear
ch Institut
e, Wuha
n, Hub
e
i Pr
ovinc
e
, 430
072
, China
Ab
stra
ct
Accordi
ng to
re
leva
nt stan
dar
ds a
nd s
pec
ific
ations
at
ho
me
an
d a
b
ro
ad, th
e acc
epta
n
ce t
e
sts that
must b
e
perfor
m
e
d
to val
i
d
a
te w
hether the
grid-co
n
n
e
ct
io
n/splittin
g
proc
ess an
d gri
d
-conn
ectio
n
op
er
ation
o
f
micr
o-gri
d
me
et the re
leva
n
t
technic
a
l re
quir
e
m
ents
ha
ve be
en st
udi
ed i
n
this
pa
per. Co
mbin
in
g t
h
e
technic
a
l r
equ
i
r
ements of th
e
micr
o-gri
d
, thi
s
pap
er
g
i
ves
the co
nditi
ons,
measur
ing
in
strume
nts, ge
n
e
ral
process
an
d
a
cceptanc
e sta
ndar
ds of
the
accepta
n
ce
te
sts, and f
o
cus
e
s o
n
th
e d
e
si
gni
ng
of acc
e
p
t
ance
tests of key operati
on, op
er
ation p
a
ra
meters and
prote
c
tion functi
ons
of
the micro-
grid, such
as grid-
conn
ectio
n
/spli
tting process,
pow
er qu
ality
duri
ng t
he gr
i
d
-con
nectio
n
o
perati
on a
nd r
e
verse p
o
w
e
r and
short-circuit
pr
otection
an
d s
o
on. T
h
e re
le
vant test
meth
ods, spec
ific st
eps a
nd
acce
p
t
ance sta
ndar
d
s
are
prop
osed. T
h
i
s
pap
er can
provi
de
a go
o
d
foun
dati
on and basis
fo
r
desi
gni
ng th
e acce
ptanc
e
tests
specific
ation of
micro-
grid.
Ke
y
w
ords
: mi
crogrids, gr
id-c
onn
ectio
n
/splitt
i
ng, pow
er
q
ual
ity, reverse po
w
e
r, acceptanc
e test
Copy
right
©
2014 In
stitu
t
e o
f
Ad
van
ced
En
g
i
n
eerin
g and
Scien
ce. All
rig
h
t
s reser
ve
d
.
1. Introduc
tion
Micro-g
r
id h
a
s
bee
n wi
del
y rese
arche
d
in re
c
ent ye
ars fo
r its fle
x
ible config
uration and
easy o
p
e
r
ati
on, it ca
n im
prove th
e safety and re
lia
bility of powe
r
sy
stem
whil
e improving t
h
e
power
quality
and
servi
c
e l
e
vel of the
su
pply to
cu
sto
m
er, thu
s
ca
n p
r
omote
th
e ap
plication
s
of
rene
wa
ble en
ergy dist
ribut
ed gen
eratio
n
s
[1-3].
When accessed to di
stri
bution net
work, mi
cro-gri
d
will have effects on the voltage
distrib
u
tion, p
o
we
r flow, po
wer q
uality, relay pr
ote
c
tio
n
and network relia
bility of the distributi
o
n
grid [4-6]. In
orde
r to limit these adverse
impacts
o
n
the normal op
eration of di
stribution n
e
twork,
IEEE
standards coordinati
ng commi
ttee 21 had
developed
seri
es
standards about the grid-
connection of
distri
bution
genera
tions,
i.e. the IEEE Standard fo
r Interconnecting Di
stributed
Re
sou
r
c
e
s
wit
h
E
l
ect
r
ic
P
o
we
r S
y
st
em
s [
7
-9]
.
More
com
p
reh
e
n
s
iv
e
spe
c
if
ic t
e
ch
nical
requi
rem
ents
on variou
s a
s
pect
s
of the operatio
n of micro
-
g
r
id were introdu
ce
d in [10].
In China, a
notification a
bout co
nst
r
u
c
ti
ng the
sta
ndard sy
ste
m
of energy stora
ge,
distrib
u
ted ge
neratio
n and
micro-g
r
id te
chnolo
g
y had been i
ssu
ed
by the State
Grid Corporation
recently, in which the
com
m
issi
oni
n
g
a
nd acce
ptan
ce test spe
c
ifi
c
ation of micro-g
r
id a
c
cessing
distrib
u
tion
system ha
s be
en liste
d in e
ngine
erin
g co
nstru
c
tion
group in the
sy
stem fra
m
ework
of micro
-
g
r
id tech
nolo
g
y standa
rd. The
r
efore, the
dev
elopme
n
t of micro-g
r
id te
chnical provi
s
i
ons
and th
e
co
rre
spo
ndin
g
a
cceptan
ce te
st
spe
c
ificat
ion
will b
e
ve
ry n
e
ce
ssary
an
d
ha
s im
po
rta
n
t
signifi
can
c
e.
This pap
er int
r
odu
ce
s th
e g
eneral item
s
of
the a
c
cept
ance te
sts
of
micro-g
r
id
a
c
ce
ssi
ng
firstly, whi
c
h
inclu
d
e
s
th
e pre-con
d
itions
, g
ene
ral
pro
c
e
s
s,
measuri
ng i
n
stru
ment
s
and
accepta
n
ce standards of t
he acce
ptan
ce tests. The
n
according to
the techni
cal
requi
rem
ents o
f
micro-g
r
id, a
c
cepta
n
ce te
sts of
key o
p
e
r
ation, ope
rati
on pa
ram
e
ters a
nd p
r
ote
c
ti
on fun
c
tion
s
of
the mi
cro
-
g
r
i
d
a
r
e
de
sign
ed, such a
s
g
r
id-co
nne
ctio
n/splitting
pro
c
e
ss,
po
wer
quality du
ring
the
grid
-conn
ecti
on op
eratio
n
and
reverse
power
and
sh
o
r
t-circuit
prote
c
tion. T
he relevant t
e
st
method
s, sp
ecific
ste
p
s and ac
ce
pta
n
ce
sta
nda
rd
s a
r
e
p
r
op
osed. Thi
s
pap
er
ca
n
provi
de
a
good fou
ndati
on and b
a
si
s
for desi
gnin
g
the accept
a
n
c
e test
s sp
eci
f
ication of the
micro
-
g
r
id.
Evaluation Warning : The document was created with Spire.PDF for Python.
TELKOM
NIKA
ISSN:
2302-4
046
Study on the
Acce
ptan
ce T
e
st Spe
c
ificat
i
on of Grid
-co
nne
cted Micro-g
r
id (L
e Jia
n
)
4945
2.
Gener
a
l Items of Grid-co
nnec
t
ion Ac
ceptance T
e
sts
2.1. Pre-co
nditio
n
s
Grid
-conn
ecti
on a
c
cepta
n
ce test
s
sho
u
l
d
be
complet
ed joi
n
tly by
micro-g
r
id
o
w
ner and
operator, e
q
u
i
pment ma
nu
facture
r
, con
s
tru
c
tion
unit and
sup
e
rvi
s
ion
unit, gri
d
ope
ration
and
disp
atchi
ng d
epartm
ent, and testing
a
gen
cy with
a
ppro
p
ri
ate qu
alification, an
d need
s to
be
provide
d
with
following con
d
itions: 1) T
h
e own
e
r of
t
he micr
o-g
r
id
must
su
bmit all the supp
orting
document
s that requi
red b
y
grid-conn
ection to
distrib
u
tion system
operation de
partme
n
t, whi
c
h
may incl
ude
the
wirin
g
di
a
g
ram
of the
micro-g
r
id,
the p
a
ra
meters, op
eratin
g
chara
c
te
risti
c
s and
operating gui
deline
s
of the main equi
p
m
ents of ea
ch unit of micro-g
r
id, the co
nfiguratio
n a
n
d
para
m
eter
settings of th
e prote
c
tion
s and
so on;
2) Mi
cro
-
g
r
i
d
ha
s co
mp
leted the fie
l
d
installatio
n
a
nd commi
ssi
oning
of its o
w
n h
a
rd
ware equipm
ents, monitori
ng
a
n
d
co
mmuni
ca
tion
softwa
r
e sy
stem, se
con
dary ci
rcuit wiring a
n
d
seconda
ry
equipme
n
t, and sub
m
itted
corre
s
p
ondin
g
rep
o
rts to t
he gri
d
; 3) Asso
ciat
ed a
u
xiliary equip
m
e
n
ts (Po
w
e
r
so
urce, gro
undi
ng,
lightning
pro
t
ection, et
c.) had
be
en
installe
d
a
n
d
tested; 4) The appli
c
ati
on
repo
rts o
f
accepta
n
ce t
e
sts ha
d be
e
n
submitted
by the in
stall
a
tion
an
d co
mmissioni
ng corpo
r
ation a
nd
it
had bee
n
a
p
p
r
oved
by
the
accepta
n
ce worki
ng gr
oup;
5) th
e a
c
cept
ance te
st p
r
o
g
ram
ha
d b
e
e
n
compl
e
ted b
y
the corpo
r
ation of installa
tion and
commi
ssioni
n
g
together
with equip
m
ent
manufa
c
turers, and it ha
d
been
reviewed and
co
nfirm
ed by the a
c
ceptan
ce
worki
ng g
r
ou
p; 6)
safety mea
s
u
r
es of a
c
cept
ance tests h
a
d
been
compl
e
ted.
2.2. Measurin
g
Equipment
Measuri
ng in
strum
ents
an
d devices in
sta
lled on the
equipm
ents
should
not ca
use th
e
cha
nge
s of test indices o
r
other ch
ara
c
teristics
of target micro-gri
d
, and their pre
c
isi
on sho
u
ld
be suitabl
e for the tests to be con
d
u
c
ted
.
The
erro
r of each mea
s
urement
sh
ould
not exceed 0
.
5
times the a
c
cura
cy of the test paramete
r
s.
The mainly u
s
ed m
e
a
s
uri
n
g instrument
s and devi
c
es
in accepta
n
ce tests may i
n
clu
de:
1) Multi-fu
ncti
on po
wer
qua
lity analyzer;
2) The
in
stru
ments requi
re
d to measure
the conn
ecti
on
status, a
c
tive/rea
ctive power, vo
ltage, current and fre
quen
cy at t
he point of com
m
on co
nne
cti
on;
3) Electroma
gnetic inte
rfe
r
en
ce testin
g
inst
rume
nt; 4) Withsta
n
d
voltage tester; 5) Rel
a
y
prote
c
tion tester.
2.3. Gener
a
l
Process
The gen
eral
pro
c
e
s
s
of accepta
n
ce
te
sts
in
cl
ud
es
: 1) T
h
e ac
ce
p
t
an
c
e
pr
o
g
r
a
m
c
a
n s
t
ar
t
when all the conditions li
sted in
1.2 are
sati
sfied;
2) An a
c
cept
ance working
grou
p mu
st
be
establi
s
h
ed b
y
the organi
zation dep
art
m
ent of t
he accepta
n
ce tests; 3
)
The
installation
and
commi
ssioni
n
g
corp
oratio
n submits the p
r
oje
c
t
compl
e
tion
report, e
quip
m
ents te
ch
n
i
cal
document
s, test repo
rts,
a
c
ceptan
ce te
st program a
nd field a
ppli
c
ation rep
o
rt to
the
acce
ptance
workin
g grou
p for revie
w
;
4) The
acce
ptance wo
rki
ng group te
st each item li
sted in the t
e
st
prog
ram
app
roved, and re
cord the resu
lts; 5) T
he p
r
oblem
s found
in acceptan
ce test must b
e
re-i
nspe
cted
by the
wo
rki
n
g g
r
oup
after
it had
bee
n
treated; 6
)
th
e
accepta
n
ce t
e
st
rep
o
rt m
u
st
be written aft
e
r the
acce
ptance test
ha
d bee
n co
mp
leted an
d rep
o
rted to th
e
workin
g g
r
ou
p to
determi
ne the
acceptan
ce
con
c
lu
sio
n
.
2.4.
Standa
rds of Accep
tan
c
e
Test
The acce
ptan
ce test repo
rt
must be sig
n
ed jointly by the acce
ptan
ce workin
g gro
up and
the in
stallatio
n
an
d
commi
ssi
onin
g
coo
peratio
n afte
r the a
c
cepta
n
ce
test
s h
a
d
co
mpleted.
The
requi
rem
ent f
o
r
and
de
adli
ne of
the l
e
ft
over
pro
b
lem
s
in
a
c
cepta
n
c
e te
st m
u
st
be
re
corded
in
test rep
o
rt, and the
s
e p
r
oble
m
s m
u
st be handle
d
by the installation a
n
d
commi
ssio
ning
corpo
r
ation to
gether
with the equipm
ent manufa
c
turers.
Acce
ptan
ce t
e
st re
port
sh
all contai
n th
e conte
n
ts a
s
followi
ng: 1
)
The
re
cord
s of the
defect
s
a
nd
deviation
s in
acce
ptan
ce
test; 2)
The
records of a
c
ceptan
ce
te
sts
and
an
al
ysis
repo
rts; 3
)
Th
e co
ncl
u
si
on
s of t
he acce
ptance test; 4
)
The mem
o
of
the pro
b
lem
s
left over in th
e
accepta
n
ce test (sho
uld
contai
n the
de
scription
s
of
the phe
nome
non, solution
s an
d expe
ct
ed
resolution tim
e
); 5) Acce
ptance test pro
g
ram.
Acce
ptan
ce tests
can b
e
consi
dered to
pass when th
e following
re
quire
ment
s h
ad bee
n
met: 1) The
system
files,
relev
ant
drawings an
d m
a
terial
s
are
all
ready
an
d
co
mplete; 2
)
T
h
e
type, quantit
y and
config
uration
of all
the e
qui
pm
ents m
eet th
e re
qui
reme
nts in
techni
cal
agre
e
me
nt; 3) Th
e result o
f
each of the
accepta
n
ce test mu
st me
e
t
the re
quire
ment p
r
opo
se
d in
Evaluation Warning : The document was created with Spire.PDF for Python.
ISSN: 23
02-4
046
TELKOM
NI
KA
Vol. 12, No. 7, July 201
4: 4944 – 49
53
4946
this pap
er; 4
)
No defe
c
tive
items
；
5
)
Th
e numb
e
r of
deviation ite
m
s do
es n
o
t excee
d
5% of the
total numbe
r of tests.
3.
Acc
e
ptance
Test o
f
Grid-conne
ction/
splitting Op
e
r
ation
3.1.
Acc
e
ptance
Test o
f
Grid-conne
ction
Equipment
The p
u
rp
ose
of this te
st is to ve
rify
that the in
stalled
grid
-conne
ction
eq
uipment
posse
sse
s
the perfo
rman
ces a
s
decl
a
red by the m
anufa
c
ture
rs. Note that this test is not
a
comp
ositio
n
of field a
c
cep
t
ance te
st, b
u
t instea
d it
i
s
a
pre
r
e
quisite con
d
ition.
The te
sts li
sted
here
sho
u
ld be use
d
as p
a
rt of the equipment ty
pe test or facto
r
y acce
ptan
ce test, and may
be
compl
e
ted in laboratory, factory or in th
e field.
Some of these tests may be sel
e
cted to pe
rform
in the field accepta
n
ce test
if needed. T
he main re
lev
ant tests a
n
d
method
s are
:
1) Test of the
synchro
n
ization fun
c
tion o
f
the grid
-con
nectio
n
dev
i
c
e. The te
st method i
s
main
ly accordi
ng t
o
that given in JB/T395
0-1
9
9
9
Autom
a
tic synch
r
oni
zin
g
device
, an
d the test re
sults mu
st meet
the req
u
ire
m
ents of this
standard; 2) E
l
ectro
m
ag
neti
c
co
mpatibilit
y emissi
on le
vel test of th
e
grid
-conn
ecti
on d
e
vice.
T
he te
st meth
od
can
ad
op
t that prescri
bed i
n
GB/T
177
99.3-20
01
Electrom
agn
etic comp
atibi
lity:
Generi
c
standards-
Em
issi
on stan
da
rd
fo
r
re
siden
tial, comm
ercial
and lig
ht-ind
ustrial
enviro
n
ments
o
r
G
B
/T 17799.4
Electrom
a
gnetic com
p
atibility:
Generic
stand
ard
s
- E
m
issi
on
stan
dard
for ind
u
s
trial
environ
ments
fo
r re
sidential, com
m
ercial and
li
ght-
indu
strial or industri
a
l environm
ents resp
ecti
vely
, and the test re
sults
must meet the
requi
rem
ents of these
sta
ndards; 3
)
El
ectro
m
ag
net
i
c
compatibilit
y immunity level test of the
grid
-conn
ecti
on devi
c
e.
The el
ectrostatic disc
h
a
rge immu
nity, RF ele
c
tromagn
etic fi
eld
immunity, surge immu
nity, immunity to
condu
ct
ed
disturban
ce
s,
induce
d
by radio
-
fre
que
n
cy
fields, and v
o
ltage dip
s
,
sho
r
t interru
p
tions a
nd v
o
ltage vari
ations im
munit
y
of the grid-
con
n
e
c
tion
device
can
be tested b
y
adopting
the method
s propo
se
d in GB/T 176
26
Electrom
agn
etic com
pati
b
ility: Testing and mea
s
ureme
n
t techni
que
s
serie
s
stan
da
rds
respe
c
tively,
and the test result
s must
meet the
req
u
irem
ents of
these
stand
a
r
ds; 4
)
Diel
ectric
withsta
nd vol
t
age test. Th
is test can b
e
perfo
rm
ed
to the dielectri
c
with
stan
d voltage level
betwe
en
th
e input circuit and gro
und, output circ
uit
and
groun
d
and
input
ci
rcuit
and
out
put
circuit re
spe
c
tively accordi
ng to the method given i
n
GB5015
0-2006
The gu
ide of electri
c
al
equipm
ent in
stallation en
g
i
neeri
ng ele
c
t
r
ical e
quipm
e
n
t
, and the test re
sults
must meet the
requi
rem
ents of this stand
ard; 5) T
e
mp
eratu
r
e st
a
b
ili
ty test. This test ca
n be p
e
rform
ed in l
o
w
temperature,
high temp
era
t
ure an
d stea
dy damp h
e
a
t
condition
s resp
ectively a
c
cordi
ng to the
method
s give
n in GB/T 24
23
Environm
ental testin
g
for ele
c
tri
c
a
nd ele
c
tro
n
ic prod
uct
s
se
r
i
es
stand
ard
s
, an
d the test re
sults mu
st m
eet the requi
re
ments of the
s
e stand
ard
s
;
3.2.
Acc
e
ptance Test
o
f
Grid Conn
ection Function
3.2.1.
Technic
a
l Requiremen
t
s
of Grid-c
on
nection
The im
pa
cts of gri
d
-con
n
e
ction
ope
rat
i
on of
cha
r
g
ed mi
cro-g
r
id
on the
di
stribution
power sy
ste
m
must limite
d
to an acce
ptable level.
Micro-g
r
id in
this ci
rcu
m
st
ance ca
n be
see
n
as
an
equival
ent ge
nerator, so th
e requi
reme
nt to
the
tech
nical pa
rameters
and
grid
-conn
ecti
on
pro
c
e
s
s may
refer to the
correspon
ding
regul
ation
s
fo
r ge
nerator in
ter-con
n
e
c
tio
n
. In 5.7 in
JB/T
3950
-19
9
9
a
u
tomatic syn
c
hroni
zing de
vice
, it states that: “Th
e
device
dete
c
ts the fre
que
n
cy
differen
c
e b
e
twee
n the po
wer
system
a
nd the sy
ste
m
to be parall
e
led,
and fre
quen
cy difference
tuning ra
nge
of allowing
to issue th
e clo
s
ing p
u
lse
sho
u
ld
be sele
cte
d
betwe
en
1/16
(1/10
)
~1/2Hz”. In 5.8 in the same
stand
a
r
d, it
also p
r
o
v
ides that: “T
he device det
ects the volta
g
e
amplitude dif
f
eren
ce bet
ween the po
wer syste
m
a
nd the syste
m
to be paralleled, and
the
voltage ampli
t
ude differe
n
c
e tunin
g
ra
nge of allo
wi
ng to issue t
he clo
s
in
g p
u
lse
sho
u
ld
be
sele
cted b
e
tween ± 3%
~±
10% (or
±5%
~
±10%) of rat
ed voltage.”
The all
o
wabl
e ra
nge
s
of the p
a
ram
e
ters
du
ring
syn
c
hrono
u
s
inte
rconn
e
c
tion
of
distributed generation
gi
ven in IEEE Std. 1547-2003
are shown i
n
Tabl
e 1, and this standard
also p
r
ovide
s
that: “All
the three pa
ram
e
ters liste
d
in this table mu
st be in the given ran
ge at the
instan
ce
of the cl
osi
ng of
the gri
d
-con
necte
d dev
i
c
e. If any of these pa
ram
e
ters i
s
o
u
t of the
rang
e de
scrib
ed in this tabl
e, t
he parallel
device can’t be clo
s
e
d
.”
Evaluation Warning : The document was created with Spire.PDF for Python.
TELKOM
NIKA
ISSN:
2302-4
046
Study on the
Acce
ptan
ce T
e
st Spe
c
ificat
i
on of Grid
-co
nne
cted Micro-g
r
id (L
e Jia
n
)
4947
Table 1. Synchroni
zatio
n
Param
e
ters Li
mits for DG P
a
ralleli
ng
DR unit Total
Capacit
y
(kVA)
Freque
nc
y
difference
(
∆
f
, Hz)
Voltage
difference
(
∆
V
, %)
Phase angle
difference
(
∆
Φ
,º)
0~500 0.3
10
20
>500~1500
0.2
5
15
>1500~10000
0.1
3
10
The selectio
n
of the allowa
ble ran
ge of these three te
chni
cal p
a
ra
meters ca
n take into
account the national standards and the
requi
rem
ents of
IEEE
Std.
1547
comprehensively.
3.2.2.
Field Simula
tion Ac
cep
ta
nce Tes
t
of Grid-co
nnec
t
ion/splitting
Function
The pu
rp
ose
of this test i
s
to verify that
the gri
d
-co
nne
ction d
e
vice
can pe
rform
th
e grid-
con
n
e
c
tion o
peratio
n reli
a
b
ly and accu
rately while
all the techni
cal pa
ram
e
te
rs a
r
e in the
i
r
allowable
ra
n
ge respe
c
tively at the i
n
stan
ce
of pa
rallelin
g by
simulating th
e
grid
-con
ne
ction
pro
c
e
ss, a
n
d
to verify that the grid
-conne
ction d
e
v
ice can pe
rform the
spli
tting operation
according to the splitting o
r
der reliably a
nd accu
rately
The test procedure is a
s
following:
a) Co
mplete
the system conne
ction a
c
cordi
ng to th
e test schem
e, disconne
ct
any one
of
the swit
ch
es between
micro-g
r
id
an
d
po
we
r sy
st
em, and
pe
rf
orm vi
sual
in
spe
c
tion
to e
n
su
re
that this
switch is in th
e off
positio
n. Insp
ect the
ratin
g
, pha
se
an
d
conne
ction
of t
he
curre
n
t an
d
voltage tran
sducer u
s
ed in
the test;
b) Conn
ect t
he test e
qui
pment, and
monito
r th
e
grid
-conn
ecti
on orde
r, the pha
se
relation
shi
p
betwe
en the
micro
-
g
r
id side an
d
sy
stem sid
e
o
f
the paralle
ling device,
the
freque
ncy of the
voltage o
f
micro-g
r
id a
nd
po
we
r
system, an
d all
the ph
ase v
o
ltage
s of b
o
th
side
s;
c)
Di
sabl
e th
e gri
d
-co
nne
ction fun
c
tion,
and
adju
s
t th
e freq
uen
cy d
i
fference a
nd
voltage
amplitude
differen
c
e
betwe
en micro
-
gri
d
and sy
stem
are
within the
allowa
ble ra
nge
s at lea
s
t
3
minutes;
d) Verify that the parall
e
lin
g device h
a
s
not initiated g
r
id-co
nne
ctio
n operation;
e) Ena
b
le the
grid
-conn
ecti
on fun
c
tion.
Verify that the pa
rallelin
g
device
ha
s completed
the grid-co
n
n
e
ction op
eration, and re
co
rd the par
alleli
ng time. Record the wave
forms of all the
pha
se voltag
es of the mi
cro-grid
and
p
o
we
r sy
st
em
durin
g pa
rall
eling p
r
o
c
e
s
s, and re
co
rd
the
freque
ncy dif
f
eren
ce, voltage am
plitud
e differen
c
e
and ph
ase a
ngle differen
c
e bet
wee
n
the
micro-gi
rd
sid
e
and sy
stem
side of the p
a
ra
lleli
ng devi
c
e at the mo
ment of clo
s
ing;
f) Re
cord the setting value
s
of all the parameters du
rin
g
the test;
g) Issu
e splitting co
mman
d
and ve
rify that the pa
ra
lleling d
e
vice
has
co
mplet
ed the
splitting op
eration. Re
cord
the splitting time;
i) Reg
u
late th
e voltage and
frequen
cy of
micro
-
gi
rd to
chan
ge the frequ
en
cy differen
c
e
and voltag
e
amplitude
differen
c
e,
but still in the
allo
wabl
e range
of these
pa
ra
meters, re
pe
at
step c) to g) 1
-
2 times.
The a
c
cepta
n
ce
criteria
o
f
this test a
r
e t
hat in any
of the abov
e tests, th
e
parall
e
ling
device can perfo
rm
the grid
-conn
ecti
on
ope
ration
corre
c
tly, and all the p
a
ram
e
ters at
the
moment of cl
osin
g are well
within their al
lowa
bl
e ran
g
e
. In any of th
e above tests, the paralleli
ng
device
can
p
e
rform
the
sp
litting ope
rati
on
corre
c
tly, and th
e
splitting time
mu
st
meet the
de
si
gn
specification.
It should be n
o
ted that the setting value
limits of
relevant prote
c
tion
s of micro
-
g
r
i
d
must
be
con
s
id
ere
d
du
ring
the t
e
sts, fo
r th
e a
d
justme
nt of
voltage a
nd freque
ncy
of m
i
cro
-
g
r
id
sh
ou
ld
not active th
ese
protectio
n
s
(such a
s
over-v
olta
ge
, unde
r-volta
ge, low-fre
q
u
ency o
r
hi
gh
-
freque
ncy p
r
o
t
ection). Th
ese prote
c
tion
s
may be out of service wh
en
nece
s
sary.
3.2.3.
Acc
e
ptance
Test
w
i
th Fr
equen
c
y
/
v
o
lt
age Ch
ange
s
The pu
rp
ose
of this test i
s
to verify that
the gri
d
-co
nne
ction d
e
vice
can pe
rform
th
e grid-
con
n
e
c
tion o
peratio
n reli
a
b
ly and accu
rately a
fter the voltage/ frequ
en
cy de
viation cha
n
g
e
s
from outsi
de the allo
wable
rang
e to insid
e
the allowabl
e rang
e.
The test procedure is a
s
following:
Evaluation Warning : The document was created with Spire.PDF for Python.
ISSN: 23
02-4
046
TELKOM
NI
KA
Vol. 12, No. 7, July 201
4: 4944 – 49
53
4948
a) Co
mplete
the system conne
ction a
c
cordi
ng to th
e test schem
e, disconne
ct
any one
of
the swit
ch
es between
micro-g
r
id
an
d
po
we
r sy
st
em, and
pe
rf
orm vi
sual
in
spe
c
tion
to e
n
su
re
that this
switch is in th
e off
positio
n. Insp
ect the
ratin
g
, pha
se
an
d
conne
ction
of t
he
curre
n
t an
d
voltage tran
sducer u
s
ed in
the test;
b) Conn
ect t
he test e
qui
pment, and
monito
r th
e
grid
-conn
ecti
on orde
r, the pha
se
relation
shi
p
betwe
en the
micro
-
g
r
id side an
d
sy
stem sid
e
o
f
the paralle
ling device,
the
freque
ncy of the
voltage o
f
micro-g
r
id a
nd
po
we
r
system, an
d all
the ph
ase v
o
ltage
s of b
o
th
side
s;
c)
Disable th
e grid
-conn
e
c
tion fun
c
tion
. Adju
st the frequ
en
cy/voltage of micro
-
gird to
ensure th
at the freq
uen
cy/voltage
difference bet
wee
n
micro-gri
d
and p
o
wer
system i
s
within
the
allowable
ran
ge an
d keep
con
s
tant. Adj
u
st the
pha
se
angel
differe
nce to
be
wit
h
in the all
o
wable
rang
e and
ke
ep co
nsta
nt.
Adjust and m
a
intain the voltage/frequ
en
cy of micro
-
gi
rd to be high
er
than that of powe
r
syste
m
and the volta
ge/frequ
en
cy differen
c
e is
out of the allowabl
e ran
ge;
d) Enabl
e th
e grid
-conn
e
c
tion fun
c
tion
and ve
rify that the pa
ral
l
eling devi
c
e
has n
o
t
initiated grid
-con
ne
ction o
peratio
n in at least 3 minut
es;
e) Redu
ce t
he voltage/freque
ncy diff
eren
ce
between mi
cro-g
r
i
d
and
po
wer system
grad
ually to be within the
allowable ran
ge. Veri
fy that the paralleli
ng device ha
s co
mplete
d the
grid
-conn
ecti
on ope
ration
and re
co
rd th
e parall
e
ling t
i
me.
f) Re
cord the setting value
s
of all the parameters du
rin
g
the test;
g) Adju
st a
n
d
maintai
n
the voltage/freque
ncy
of
micro-gi
rd to
be lo
we
r th
an that of
power sy
ste
m
, repeat ste
p
c) to f).
The a
c
cepta
n
ce
criteria
o
f
this test is
t
hat in any o
f
the above t
e
sts, the
pa
ralleling
device will
pe
rform
the gri
d
-co
nne
ction o
peratio
n whe
n
and
only when all the
p
a
ram
e
ters m
eet
the techni
cal
requi
rem
ents.
3.2.4.
Field Acce
ptance Te
st o
f
Grid-co
nnec
t
ion Func
tio
n
The pu
rp
ose
of this test i
s
to verify that
the ene
rgi
z
ed mi
cro-gri
d
ca
n gri
d
-co
nne
ct to
power
syste
m
relia
bly an
d accu
rately
throug
h t
he parall
e
ling d
e
vice
in
a
c
corda
n
ce with
the
techni
cal req
u
irem
ents.
The test procedure is a
s
following:
a)
Com
p
lete
the sy
stem
conne
ction
a
c
cording
to th
e test
schem
e. Insp
ect th
e ratin
g
,
pha
se an
d co
nne
ction of the curre
n
t and
voltage transducer u
s
ed in
the test;
b) Conn
ect t
he test e
qui
pment, and
monito
r th
e
grid
-conn
ecti
on orde
r, the pha
se
relation
shi
p
betwe
en the
micro
-
g
r
id side an
d
sy
stem sid
e
o
f
the paralle
ling device,
the
freque
ncy of the
voltage o
f
micro-g
r
id a
nd
po
we
r
system, an
d all
the ph
ase v
o
ltage
s of b
o
th
side
s;
c)
Di
sabl
e th
e gri
d
-co
nne
ction fun
c
tion,
and
adju
s
t th
e freq
uen
cy d
i
fference a
nd
voltage
amplitude
differen
c
e
betwe
en micro
-
gri
d
and sy
stem
are
within the
allowa
ble ra
nge
s at lea
s
t
3
minutes;
d) Verify that the parall
e
lin
g device h
a
s
not initiated g
r
id-co
nne
ctio
n operation;
e) Ena
b
le the
grid
-conn
ecti
on fun
c
tion.
Verify that the pa
rallelin
g
device
ha
s completed
the grid-co
n
n
e
ction op
eration, and re
co
rd the par
alleli
ng time. Record the wave
forms of all the
pha
se voltag
es of the mi
cro-grid
and
p
o
we
r sy
st
em
durin
g pa
rall
eling p
r
o
c
e
s
s, and re
co
rd
the
freque
ncy dif
f
eren
ce, voltage am
plitud
e differen
c
e
and ph
ase a
ngle differen
c
e bet
wee
n
the
micro-gi
rd
sid
e
and sy
stem
side of the p
a
ra
lleli
ng devi
c
e at the mo
ment of clo
s
ing;
f) Re
cord the setting value
s
of all the parameters du
rin
g
the test;
The a
c
cepta
n
ce
criteri
a
o
f
this te
st is that
in the above tes
t, th
e
parall
e
ling
de
vice can
perfo
rm the
g
r
id-co
nne
ctio
n ope
ratio
n
correctly, and
all the p
a
ra
m
e
ters at the
m
o
ment of
clo
s
ing
are
well
with
in allo
wabl
e
rang
e. Thi
s
t
e
st o
n
ly ne
e
d
s to
be
pe
rformed
on
ce
if no
sp
eci
a
l
requi
rem
ent.
3.2.5.
Field Acce
ptance Te
st o
f
Splitting Fun
ction
The
purpo
se
of this te
st
is to ve
rify t
hat the
micro-g
r
id
ca
n di
sconn
ect f
r
o
m
po
we
r
system relia
bly and saf
e
ly through
parall
e
ling d
e
vice in a
c
corda
n
ce with
the techni
cal
requi
rem
ents.
The splitting
pro
c
e
ss
ma
y perform
a
u
tomatically
or ma
nually.
The a
c
cept
ance test
pro
c
ed
ure of automatic
spli
tting function
is as follo
win
g
:
Evaluation Warning : The document was created with Spire.PDF for Python.
TELKOM
NIKA
ISSN:
2302-4
046
Study on the
Acce
ptan
ce T
e
st Spe
c
ificat
i
on of Grid
-co
nne
cted Micro-g
r
id (L
e Jia
n
)
4949
a)
Com
p
lete
the sy
stem
conne
ction
a
c
cording
to th
e test
schem
e. Insp
ect th
e ratin
g
,
pha
se an
d co
nne
ction of the curre
n
t and
voltage transducer u
s
ed in
the test;
b) Conn
ect t
he test eq
uip
m
ents, an
d
monitor
the
splitting ord
e
r.
Ensu
re that
micro-g
r
id
is grid
-con
ne
cted.
c) Issu
e splitti
ng com
m
an
d, measu
r
e a
n
d
reco
rd the
sp
litting time.
The acce
ptan
ce test p
r
o
c
e
dure of ma
nu
al splitting fun
c
tion is a
s
foll
owin
g:
a)
Com
p
lete
the sy
stem
conne
ction
a
c
cording
to th
e test
schem
e. Insp
ect th
e ratin
g
,
pha
se an
d co
nne
ction of the curre
n
t and
voltage transducer u
s
ed in
the test;
b) Conn
ect t
he test eq
uip
m
ents, an
d
monitor
the
splitting ord
e
r.
Ensu
re that
micro-g
r
id
is grid
-con
ne
cted;
c)
Di
sconn
ect
the micro
-
po
wer an
d majo
r ele
c
tri
c
al eq
uipment
s
in micro-g
r
id gradually,
and shed
ding
the loads in
micro-g
r
id g
r
adually;
d)
Confirm th
at the current
of paralleli
n
g
device
app
roache
s zero, and th
en di
scon
ne
ct
the parall
e
lin
g device ma
n
ually.
This test is o
n
ly aimed at the pro
c
e
ss f
r
om
splitting orde
r issue
d
to splitting op
eration
compl
e
ted
without co
nsi
d
ering th
e re
aso
n
s
ca
usi
ng splitting. This te
st onl
y need
s to
be
perfo
rmed o
n
c
e if no sp
eci
a
l requi
rem
e
n
t
.
4.
Integra
t
ed
Accep
tanc
e T
est o
f
Po
w
e
r
Qualit
y
of Grid-conn
ec
tion Opera
t
io
n
The purpose of this
tes
t
is
to verify that
all the po
wer quality in
dicato
rs at PCC
meet
corre
s
p
ondin
g
tech
nical requireme
nts durin
g
the
gi
rd-co
nne
ction
operation of
micro-g
r
id.
The
power q
uality indicato
rs m
a
y includ
e cu
rre
nt/v
oltage harm
oni
cs, voltage fluctu
a
t
ion and flicker,
voltage unb
al
ance and p
o
w
er fa
ctor.
The test procedure is a
s
following:
a)
Compl
e
te
the syste
m
wiring a
c
co
rdin
g to
the te
st scheme. In
sp
ect the
rating
, phase
and
co
nne
cti
on of
the
current a
n
d
voltage t
r
an
sd
uce
r
used i
n
the te
st, a
nd in
sp
ect
the
con
n
e
c
tion of
the powe
r
qu
ality analyzer
use
d
in test;
b) En
su
re
th
at micro
-
gri
d
ope
rate
s in
grid
-con
ne
ction mo
de
an
d with
out a
n
y
micro-
power
in se
rvice.
Mo
nitor
and record all the powe
r
quality indicators
contin
u
ously at least
24
hours;
c)
Colle
ct mo
nitoring d
a
ta and an
alysi
s
statistically.
The i
n
tegrate
d
a
c
ceptan
ce test
proce
dure
of power quality
i
s
relatively
si
m
p
le.
The
techni
cal req
u
irem
ents,
m
easure
m
ent method
s
an
d
accepta
n
ce
crite
r
ia of all
the po
wer
qu
ality
indicators are
given belo
w
.
4.1. Harmonic
s
The voltage/
curre
n
t ha
rm
onic
ch
ara
c
t
e
risti
c
s at PCC i
n
voked
by micro-g
r
id a
r
e
determi
ned
b
y
the ch
ara
c
t
e
risti
c
of p
o
w
er sy
stem
, the
co
mpo
s
iti
on
an
d cha
r
acteri
stics of
th
e
micro-p
o
wer
in micro
-
gird, and the
co
nne
cted lo
ad
and e
quip
m
ent. The
cu
rrent h
a
rm
oni
c
injecte
d
to P
CC
by pa
rall
eling mi
cro-g
r
id
sho
u
ld m
eet the relev
ant re
quirem
ents p
r
o
p
o
s
e
d
in
GB1454
9-19
93
Q
uality o
f
elect
r
ic en
e
r
gy
sup
p
ly: Harmoni
cs in
publi
c
su
ppl
y netwo
rk
. The
particula
r re
q
u
irem
ent of the indi
cato
r o
f
harmo
ni
c te
st ca
n be
re
solved a
c
cordi
ng to the m
e
thod
given in this standard.
The 95% probability values of three
phase
current harmonics are
calculated based
on
the re
co
rd
da
ta, and th
e
maximum val
ue of th
ree
p
hases is cho
s
en
a
s
the
b
a
se
to d
e
termine
wheth
e
r the current harmo
nic e
xceed
s the tolera
nce or not.
Note that the
backg
rou
nd
of curre
n
t ha
rmoni
c at PCC befo
r
e the
intera
ction of
micro-
grid mu
st be
obtaine
d to ensu
r
e that th
e mea
s
ur
ed current harmo
nic that
exce
eds the tole
ra
nce
is not
cau
s
e
d
by power
system. The vol
t
age ha
rmo
n
i
c
THD at P
C
C befo
r
e mi
cro-g
r
id p
a
rall
el
ed
sho
u
ld be le
ss tha
n
2.5%
. Due to the
fact that
the curre
n
t harm
onic inj
e
cte
d
by micro
-
g
r
id
at
PCC is g
r
eat
ly affected by the operation mode of
micro-g
r
id, the harmo
nic
chara
c
te
risti
c
s of
micro-p
o
wer
and l
oad
s in
micro-gri
d
,
addition
al te
sts
ca
n b
e
perfo
rmed
d
epen
d o
n
a
c
tual
situation.
Evaluation Warning : The document was created with Spire.PDF for Python.
ISSN: 23
02-4
046
TELKOM
NI
KA
Vol. 12, No. 7, July 201
4: 4944 – 49
53
4950
4.2.
Voltage Fluc
tua
t
ion and
Flicker
The voltage fl
uctuatio
n an
d
flicke
r at PCC ca
u
s
ed
by micro-g
r
id
pa
rallele
d shoul
d meet
the re
quirem
ent of cl
au
se
4 an
d 5 in
G
B
12326
-2
008
Quality of el
ectri
c
e
nergy sup
p
ly: Voltage
fluctuation a
n
d
flicke
r
respec
tively.
The tole
ran
c
e of voltage
flicke
r cau
s
e
d
by
micro-g
r
id sepa
ratel
y
can be
det
ermin
e
d
depe
nd o
n
th
e load
of micro-grid, the
ra
tio of ca
p
a
cit
y
on agreem
ent to total el
ectri
c
ity cap
a
c
ity
and the condi
tion of PCC a
c
cordi
ng to t
he method spe
c
ified in GB1
2326
-20
08.
All the long term voltage flicker
severity m
easured at PCC un
de
r the minimum o
perati
n
g
plan of micro-grid du
rin
g
the integrate
d
p
o
we
r quality test sh
ould b
e
within the given limit.
The long te
rm voltage flicker
seve
rity caused
by micro-grid
sep
a
rately can be
solved a
s
:
33
3
21
0
It
It
It
PP
P
(
1)
Whe
r
e
P
It
1
i
s
the mea
s
u
r
e
m
ent of the l
ong te
rm vo
lt
age flicke
r
se
verity with mi
cro
-
g
r
id
interconn
ecte
d;
P
It
0
is the measurement
of the long t
e
rm vo
ltage fl
icker
seve
rity with micro
-
grid
discon
ne
cted
, and
P
It
2
is th
e long term v
o
ltage flicker
severi
ty ca
used by micro-g
r
id se
pa
rately
It should
be
noted that a
dditional te
st
must
b
e
pe
rforme
d to o
b
tain the b
a
ckgroun
d
voltage
flicke
r severity with
micro
-
g
r
id discon
ne
ct
ed
before thi
s
t
e
st. As for th
ere i
s
no
gen
erally
accepte
d
test
method
and
no sophi
sticated test d
e
vice fo
r voltag
e fluctuatio
n
at pre
s
ent, t
he
voltage fluctu
ation could
b
e
estim
a
ted a
c
cordi
ng to th
e metho
d
pro
v
ided in GB
1
2326
-20
08, a
nd
only the acce
ptance test for voltage f
licker mea
s
u
r
em
ent results is
need
ed.
4.3. Voltage
Unb
a
lance
The three
-
p
h
a
se voltage
unbal
an
ce at PCC whe
n
micro-g
r
id int
e
rconn
ecte
d (only for
three
-
ph
ase
micro-g
r
id
) m
u
st m
eet: 1
)
The
requi
re
ments provid
ed in
clau
se
4 i
n
GB
155
43
Quality of
ele
c
tri
c
e
nergy
sup
p
ly: Thre
e-ph
ase volta
ge u
nbal
an
ce
, i.e. the
all
o
wa
ble val
u
e
is
2%, and
the
sho
r
t-te
rm va
lue may
not e
x
ceed
4%; 2
)
The
allo
wabl
e limit of n
e
g
a
tive se
quen
ce
voltage unbal
ance at PCC cau
s
e
d
by each co
nsume
r
acce
ssed to this point is 1.
3% in genera
l
,
but the sho
r
t-term value m
a
y not excee
d
2.6%.
The 9
5
% probability valu
es of
RMS
of t
he mea
s
ured
ne
gative-sequ
en
ce
voltage
unbal
an
ce in
10 min
u
tes i
s
cho
s
e
n
a
s
th
e ba
sis fo
r d
e
termini
ng
whether the vo
ltage un
bala
n
c
e
excee
d
s the t
o
lera
nce or n
o
t.
Note that the
deg
ree
of voltage un
bala
n
c
e at
P
CC i
s
norm
a
lly judg
ed by the d
e
g
ree
of
negative
seq
uen
ce voltag
e unb
alan
ce,
and th
ere
is
usu
a
lly no
requireme
nt to ze
ro
-sequ
e
n
ce
voltage unb
al
ance in low v
o
ltage sy
ste
m
. The deg
ree of voltage
unbala
n
ce caused by micro
-
grid i
s
g
r
eatl
y
affected by
the op
eratio
n mod
e
of m
i
cro
-
g
r
id
and
the c
haracte
ristics of
micro-
power a
nd lo
ads in mi
cro-grid, ad
dition
al test ca
n b
e
perfo
rme
d
depe
nd on
a
c
tual situ
atio
n if
necessa
ry. The ba
ckgrou
nd of voltag
e unb
alan
ce
degree at
PCC b
e
fore
the intera
ctio
n of
micro-g
r
id m
u
st be obtain
ed to ensu
r
e
that t
he measu
r
ed voltag
e unbala
n
ce that exceed
s the
toleran
c
e i
s
n
o
t cau
s
ed by
power sy
ste
m
.
4.4. Po
w
e
r
Fac
t
o
r
The po
we
r factor at PCC must meet the req
u
ire
m
e
n
t in
Powe
r system volta
ge and
rea
c
tive po
wer control re
g
u
lation
s 200
4
when mi
cro-grid a
b
sorbs i
ndu
ctive rea
c
tive powe
r
. T
hat
is: “In 35
kV
~ 220
kV su
bstation, the powe
r
facto
r
of prima
r
y si
de of main t
r
an
sform
e
r
with
maximum loa
d
sho
u
ld be l
e
ss than 0.9
5
, while sh
ou
ld not excee
d
0.95 with valley load”, “The
requi
rem
ent
of the po
wer
factor
of ele
c
tricity co
nsum
ers with 3
5
kV
and a
bove
can refe
r to t
he
same
provi
s
i
on; The po
we
r factor of 1
0
k
V co
nsumers with 10
0kV
A
and above
sho
u
ld be a
b
o
ve
0.95, and the
power facto
r
of ot
her u
s
ers shoul
d be ab
ove 0.9”.
The po
we
r factor of micro
-
grid at PCC meas
ured in i
n
tegrate
d
po
wer q
uality test must
meet the req
u
irem
ents li
sted above.
The po
we
r factor
can be
calcul
ated a
s
belo
w
:
2
2
cos
Q
P
P
W
W
W
(
2)
Evaluation Warning : The document was created with Spire.PDF for Python.
TELKOM
NIKA
ISSN:
2302-4
046
Study on the
Acce
ptan
ce T
e
st Spe
c
ificat
i
on of Grid
-co
nne
cted Micro-g
r
id (L
e Jia
n
)
4951
Whe
r
e co
s
φ
i
s
the ave
r
ag
e
power fa
ctor
durin
g test p
e
r
iod;
W
P
and
W
Q
is
th
e mea
s
ur
e
d
active and re
active ene
rgy
during the te
st perio
d re
sp
ectively.
Note that the
powe
r
facto
r
of micro
-
gri
d
at PCC is
greatly affe
ct
ed by the op
eration
mode of mi
cro-g
r
id an
d th
e ch
ara
c
teri
stics of mi
cro
-
power a
nd lo
ads in
micro
-
grid, ad
dition
al
test
can
be
p
e
rform
e
d
de
p
end
on
a
c
tua
l
situatio
n if
necessa
ry. T
h
is te
st
sh
oul
d be
p
e
rfo
r
m
e
d
with rea
c
tive po
wer com
pen
sation
de
vices in
se
rvice
whe
n
mi
cro
-
g
r
id
co
ntains this
kin
d
of
device.
5.
Acc
e
ptance
Test o
f
Rev
e
rse Po
w
e
r Pr
otec
tion
Reverse
po
wer prote
c
tion
may
be
confi
gure
d
whe
n
micro-g
r
id
op
erate
s
i
n
n
o
n
-reve
rse
power mo
de.
But in the reversibl
e
po
wer mod
e
,
there is normally a limit
on the power delive
r
ed
from mi
cro-g
r
id to
po
wer system.
Th
e pri
n
ci
ple o
f
prote
c
ting t
he tra
n
smission po
we
r from
excee
d
ing th
e limit is the
same a
s
that
of the
reverse powe
r
protection.
So the acceptan
ce
test
for the tran
smissi
on po
we
r limit protecti
on ca
n
be carried out with
referenc
e to this
tes
t.
The metho
d
adopte
d
in the followin
g
tests is
sign
al injectio
n testin
g method.
5.1.
Acc
e
ptance
Test o
f
Mag
n
itude Settin
g
This te
st aim
s
to co
nfirm the accu
ra
cy
cha
r
a
c
teri
stic of the magn
itude setting
of non-
reverse p
o
we
r prote
c
tion.
The accu
ra
cy
of
the magnitude setting must be given
before te
st.
The test procedure is a
s
following:
a)
Compl
e
te
the syste
m
wiring a
c
co
rdin
g to
the te
st scheme. In
sp
ect the
rating
, phase
and
co
nne
cti
on of
the
current a
n
d
voltage t
r
an
sd
uce
r
used i
n
the te
st, a
nd in
sp
ect
the
con
n
e
c
tion of
the relay test
er used in test;
b) Adj
u
st the
voltage of mi
cro
-
g
r
id
and
power
syste
m
to rated va
lue an
d
kee
p
co
nsta
nt
durin
g the te
st. Adjust the
current flows from power
system to mi
cro
-
g
r
id to rat
ed value an
d
in
pha
se
with th
e po
we
r
syst
em voltage, t
hus the
pow
e
r
delive
r
ed
fro
m
po
we
r
syst
em to mi
cro-g
i
rd
is of rated val
ue;
c) Set the time delay of reverse po
we
r protection to 0
s
;
d) Step th
e
curre
n
t ampli
t
ude cl
ose to
ze
ro, an
d st
ep the
pha
se angl
e bet
ween the
curre
n
t and t
he po
we
r sy
stem voltage from 0° to
180
°
.
Keep the a
m
plitude a
nd
pha
se of
current
steady in
a
certai
n pe
rio
d
of time. At the end
of
this p
e
rio
d
, in
cre
a
se the
current amplit
ude
grad
ually;
e) Re
co
rd the
current ampli
t
ude mea
s
u
r
e
d
by relay tester;
f) Re
store the
current ampli
t
ude to rated
value and the
phase angl
e to 0°;
g) Re
peat ste
p
c) to e) th
re
e times.
In all the a
bove test
s, the mea
s
u
r
e
d
m
agnitu
de
of the cu
rrent must
sa
tisfy the
requi
rem
ent of the given amplitude a
c
cura
cy.
5.2.
Acc
e
ptance
Test o
f
Time Dela
y
Setting
This te
st aim
s
to confirm t
he a
c
cura
cy
ch
a
r
a
c
teri
stic of the time delay setting of non-
reverse p
o
we
r prote
c
tion.
The accu
ra
cy
of t
he time delay setting
must be give
n before te
st.
The test procedure is a
s
following:
a)
Compl
e
te
the syste
m
wiring a
c
co
rdin
g to
the te
st scheme. In
sp
ect the
rating
, phase
and
co
nne
cti
on of
the
current a
n
d
voltage t
r
an
sd
uce
r
used i
n
the te
st, a
nd in
sp
ect
the
con
n
e
c
tion of
the relay test
er used in test;
b) Adj
u
st the
voltage of mi
cro
-
g
r
id
and
power
syste
m
to rated va
lue an
d
kee
p
co
nsta
nt
durin
g the te
st. Adjust the
current flows from power
system to mi
cro
-
g
r
id to rat
ed value an
d
in
pha
se
with th
e po
we
r
syst
em voltage, t
hus the
pow
e
r
delive
r
ed
fro
m
po
we
r
syst
em to mi
cro-g
i
rd
is of rated val
ue;
c) Step th
e
curre
n
t am
plitude
clo
s
e to
ze
ro,
and
st
ep the
ph
ase an
gle
between t
h
e
curre
n
t and t
he po
we
r sy
stem voltage from 0° to
180
°
.
Keep the a
m
plitude a
nd
pha
se of
current
steady in a certain pe
riod
of time. At th
e end of
this period, ste
p
the curre
n
t amplitude to 1
.
2
times the rate
d value;
d) Re
co
rd the
time delay measure
d
by re
lay tester;
e) Re
sto
r
e the current am
plitude to rat
ed va
lue and
the phase a
ngle to 0°, re
peat step
c
)
to d) three
times
.
Evaluation Warning : The document was created with Spire.PDF for Python.
ISSN: 23
02-4
046
TELKOM
NI
KA
Vol. 12, No. 7, July 201
4: 4944 – 49
53
4952
In all the a
b
o
v
e tests, the
measured tim
e
delay
of rev
e
rse p
o
wer
p
r
otectio
n
mu
st satisfy
the requi
rem
ent of the given accu
ra
cy.
6.
Acc
e
ptance
Tests of Sho
r
t-cir
cuit Pro
t
ec
tion
6.1.
Accep
tance
Test of Magnitude Setting
This te
st aim
s
to co
nfirm t
he a
ccu
ra
cy
ch
a
r
a
c
teri
stic of the magni
tude setting of sho
r
t-
circuit protect
i
on. The accu
racy of the
m
agnitud
e
setti
ng must be gi
ven before te
st.
The test procedure is a
s
following:
a)
Compl
e
te
the syste
m
wiring a
c
co
rdin
g to
the te
st scheme. In
sp
ect the
rating
, phase
and
co
nne
cti
on of
the
current a
n
d
voltage t
r
an
sd
uce
r
used i
n
the te
st, a
nd in
sp
ect
the
con
n
e
c
tion of
the relay test
er used in test;
b) Set the time delay of sh
ort circuit p
r
ot
ection to 0
s
;
c) Adju
st the voltage of micro
-
g
r
id an
d power
sy
ste
m
to rated value and keep
con
s
tant
durin
g the te
st. Adjust the
cu
rre
nt flows from
po
we
r system to
micro-g
r
id to
rated val
ue
and
kee
p
it co
nst
ant duri
ng a
certai
n pe
rio
d
of time
. At the end
of this pe
ri
od, in
crease the
current
amplitude g
r
a
dually;
d) Re
co
rd the
current ampli
t
ude mea
s
u
r
e
d
by relay tester;
e) Re
sto
r
e th
e curre
n
t amplitude to rate
d value, repe
at step c) to d) three time
s;
f) Repe
at this test for each pha
se individ
ua
lly or for all
the three ph
ase
simultan
eou
sly.
In all the a
bove test
s, the mea
s
u
r
e
d
m
agnitu
de
of the cu
rrent must
sa
tisfy the
requi
rem
ent of the given amplitude a
c
cura
cy.
6.2.
Acc
e
ptance
Test o
f
Time Dela
y
Setting
This test aim
s
to confirm t
he accu
ra
cy cha
r
a
c
teri
stic of the time d
e
lay setting o
f
short-
circuit protect
i
on. The accu
racy of the ti
me delay sett
ing must be g
i
ven before te
st.
The test procedure is a
s
following:
a)
Com
p
lete the
sy
stem wiring acco
rdin
g
to
the te
st
scheme. In
sp
ect the
ratin
g
,
pha
se
and
co
nne
cti
on of
the
current a
n
d
voltage t
r
an
sd
uce
r
used i
n
the te
st, a
nd in
sp
ect
the
con
n
e
c
tion of
the relay test
er used in test;
b) Adj
u
st the
voltage of mi
cro
-
g
r
id
and
power
syste
m
to rated va
lue an
d
kee
p
co
nsta
nt
durin
g the te
st. Adjust the
cu
rre
nt flows from
po
we
r system to
micro-g
r
id to
rated val
ue
and
kee
p
it
con
s
t
ant du
ring
a
ce
rtain
pe
ri
od of
time
.
At the en
d o
f
this
peri
od,
step
the
current
amplitude to
1.2 times the
rated value;
c)
Record the
time delay measure
d
by re
lay tester;
d) Re
sto
r
e th
e curre
n
t amplitude to rate
d value, repe
at step b) to c) three time
s.
e) Re
peat thi
s
test for ea
ch pha
se indivi
dually or for a
ll the three ph
ase
simultan
eou
sly.
In all the abo
ve tests, the
measured ti
me delay
of
sho
r
t
-
cir
c
uit
p
r
ot
ect
i
o
n
mu
s
t
sat
i
sf
y
the requi
rem
ent of the given accu
ra
cy.
7. Conclu
sion
Micro-g
r
id i
s
con
s
id
ere
d
to be a mo
re suita
b
le m
ode for th
e
acce
ss
of di
stribute
d
gene
ration
s.
But the interco
nne
ction
/
splitting and
grid-co
nne
ction ope
ratio
n
will impo
se
signifi
cant effects o
n
the traditional di
stributio
n system. The de
veloping of
accepta
n
ce test
spe
c
ification
of grid-co
nne
cted micro
-
g
r
id acco
rding
to corre
s
po
n
d
ing technica
l standa
rd wi
ll
have impo
rta
n
t practi
cal si
gnifica
nce.
This
pape
r
studie
s
the a
cceptan
ce te
sts wh
i
c
h mu
st
be pe
rform
e
d
to validate whether
the grid
-con
nectio
n
/splitti
ng process
and g
r
id
-con
nectio
n
op
eration of mi
cro-g
r
id me
et
the
relevant te
ch
nical
req
u
ire
m
ents
or n
o
t. Combi
n
ing
t
he techni
cal requireme
nts
of micro-g
r
id,
this
pape
r propo
ses the p
r
e
-
condition
s, me
asu
r
ing in
struments, g
e
n
e
ral p
r
o
c
e
ss
and a
c
cepta
n
ce
stand
ard
s
of
the acce
ptan
ce te
sts, and
focu
se
s on t
he de
signi
ng
of acceptan
ce te
sts of key
operation, o
peratio
n pa
rameters a
n
d
prote
c
tion
f
unctio
n
s
of micro-g
r
id, such as
the grid-
con
n
e
c
tion/splitting pro
c
e
ss, po
we
r qu
ality dur
ing the grid
-conn
ection o
peration and reve
rse
power an
d short-circuit protecti
on. The
relevant test
methods,
sp
ecific
step
s and accepta
n
ce
stand
ard
s
are
propo
sed. This pap
er can
p
r
ovi
de
a
good fo
und
ation an
d ba
si
s
for de
sig
n
ing
the
accepta
n
ce tests
spe
c
ifica
t
ion of Micro
-
grid.
Evaluation Warning : The document was created with Spire.PDF for Python.
TELKOM
NIKA
ISSN:
2302-4
046
Study on the
Acce
ptan
ce T
e
st Spe
c
ificat
i
on of Grid
-co
nne
cted Micro-g
r
id (L
e Jia
n
)
4953
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y
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a
lee
d
KA, Z
e
ine
l
di
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Optimal
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oor
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a
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g
ri
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w
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id-c
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oor
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ontro
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urces
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ui
pme
n
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