Indonesi
an
Journa
l
of El
ect
ri
cal Engineer
ing
an
d
Comp
ut
er
Scie
nce
Vo
l.
1
3
,
No.
2
,
Febr
uar
y
201
9
, pp.
7
7
3
~
7
7
8
IS
S
N: 25
02
-
4752, DO
I: 10
.11
591/ijeecs
.v1
3
.i
2
.pp
7
7
3
-
7
7
8
773
Journ
al h
om
e
page
:
http:
//
ia
es
core.c
om/j
ourn
als/i
ndex.
ph
p/ij
eecs
A study
of refle
ction p
has
e of refle
ctarray
antenna
s
with hig
h
loss orga
nic subst
rates
M.
Y. Ism
ail
1
, H
. I
Ma
li
k
2
, S
. R.
Ma
s
rol
3
,
Sha
rmi
z
a Ad
na
n
4
1,2,3
Univer
siti
Tu
n
Hus
sein
Onn
Malay
s
ia (UTHM),
Johor,
Ma
lay
sia
4
Forest
Resea
r
ch
Instit
ut
e
Ma
lay
s
ia
(FRIM
),
Sela
n
gor,
Mal
a
y
s
ia
Art
ic
le
In
f
o
ABSTR
A
CT
Art
ic
le
history:
Re
cei
ved
Oct
29
, 201
8
Re
vised
D
ec
1
5
, 2
018
Accepte
d
D
ec
2
6
, 201
8
Thi
s
pape
r
pre
s
ent
s
an
ana
l
y
sis
of
ref
le
ction
phase
of
ref
lecta
r
ra
y
ant
enn
a
base
d
on
high
loss
orga
nic
subs
tra
te
m
ateri
a
l.
Paper
subs
tra
t
e
m
at
erial
der
ive
d
from
re
c
y
cled
m
at
er
ia
ls
was
cha
ra
ct
er
i
ze
d
for
di
elec
tr
ic
m
at
er
ial
prope
rties
.
Th
e
m
at
eri
a
l
show
s
exc
e
ll
en
t
di
elec
t
ric
m
ateri
a
l
pro
per
ties
wit
h
per
m
it
ti
vi
t
y
of
1.
63
and
loss
t
ange
nt
of
0
.
048
.
Eff
ect
of
subs
tra
t
e
he
ight
var
iation
ov
er
th
e
ref
le
c
ti
on
ph
as
e
has
b
ee
n
d
iscu
ss
ed.
Full
wav
e
ana
l
y
sis
of
the
sim
ula
t
ed
m
odel
dep
icts
that
the
red
uc
ti
on
in
subs
tra
te
height
after
a
ce
rt
ai
n
po
int
r
e
sults
in
ref
le
c
tion
phase
distor
t
ion
of
ref
le
c
ta
rr
a
y
elem
ent
.
Vali
da
ti
on
of
t
he
result
s
h
as
bee
n
done
b
y
sim
ula
ti
on,
f
abr
ic
a
ti
on
and
sca
ttering
p
aram
et
ers
m
ea
sure
m
ent
s
of
a
recta
ngul
ar
pa
tc
h
el
ement
on
proposed
subs
tr
at
e
m
at
er
ial.
T
he
result
s
show
a
broa
dband
fre
que
n
c
y
response
of
355
MH
z
and
a
p
hase
ran
ge
of
3
01º
at
a
phase
gra
die
n
t
of
0.
14
º
/MHz
.
Ke
yw
or
ds:
Diel
ect
ric m
a
ter
ia
l
Pape
r
s
ub
st
rate
Re
flect
arr
ay
a
nt
enn
a
Re
flect
ion
pha
se
Copyright
©
201
9
Instit
ut
e
o
f Ad
vanc
ed
Engi
n
ee
r
ing
and
S
cienc
e
.
Al
l
rights re
serv
ed.
Corres
pond
in
g
Aut
h
or
:
Muh
am
m
ad
Y
us
of
Ism
ai
l
,
Faculty
of Elec
tric
al
an
d El
ect
ronic E
ng
i
neeri
ng
,
Un
i
ver
sit
i T
un
Hu
s
sei
n O
nn
Ma
la
ysi
a,
Parit R
aja,
86400, Ba
tu
Pa
hat,
Johor Mal
ay
sia
.
Em
a
il
:
yuso
fi@u
t
hm
.ed
u.
m
y
1.
INTROD
U
CTION
Mi
cro
strip
ref
l
ect
arr
ay
disti
nguis
h
them
sel
ves
fr
om
oth
er
r
eflect
or
ante
nn
a
du
e
to
their
f
la
t
ref
le
ct
or
prof
il
e.
They
ha
ve
pro
ven
the
ir
capa
bili
ti
es
fo
r
l
ong
ra
ng
e
com
m
un
ic
at
ion
a
pp
li
cat
io
ns
[1
-
3].
They
c
om
bin
e
the
key
featu
r
es
of
ph
a
sed
a
rr
ay
ante
nn
a
s
and
t
he
dis
h
r
eflect
or
s
.
A
ty
pical
m
ic
ro
strip
re
flect
arr
ay
anten
na
consi
sts of
a
n
arr
ay
of r
a
diati
ng
elem
ents o
n a flat
d
ie
le
ct
ri
c su
r
face that is i
ll
u
m
inate
d
by a f
eed an
te
nn
a. Th
e
el
e
m
ents
on
t
he
arr
ay
a
re
il
lum
inate
d
in
suc
h
a
way
to
produce
a
colli
m
at
ing
beam
.
Thu
s
this
m
echan
ism
el
i
m
inate
s
the
us
e
of
any
m
ic
ro
st
rip
feed
i
ng
li
nes
f
or
the
e
lem
ents
com
par
ed
to
phase
a
r
rays.
T
his
al
s
o
cuts
the losse
s in
th
e arr
ay
due to
t
ran
sm
issi
on
li
ne
s,
th
us
e
nhanc
ing
t
he
a
nten
na
g
ai
n p
r
op
e
rtie
s.
In
order
to
m
a
xim
iz
e
the
antenn
a
gain
a
nd
directi
vity
,
pro
per
ph
asi
ng
of
ind
ivi
du
al
el
e
m
ents
on
the
arr
ay
is
requir
ed.
T
his
ha
pp
e
ns
du
e
to
s
patia
l
ph
ase
di
ff
e
r
ence
ca
us
e
d
by
the
flat
surf
a
ce
of
re
flect
or
and
the
incident
sphe
rical
wa
vefront
from
the
feed
ante
nn
a
.
T
he
incide
nt
wavefr
on
t
has
to
cov
e
r
dif
fer
e
nt
phase
le
ng
th
s
in
sp
ac
e
to
reach
the
r
eflect
arr
ay
el
em
ents
[4
]
.
So
at
ever
y
el
e
m
e
nt
on
the
ar
ray
ph
ase
com
pensat
ion
is
do
ne
acc
ordin
g
to
it
s
po
sit
ion
in
the
arr
ay
.
The
phase
unif
or
m
ity
acro
ss
the
arr
ay
is
achieve
by
inco
rpor
at
in
g
diff
e
re
nt
el
e
m
ent
sh
a
pes
su
c
h
as
var
ia
ble
siz
e
patches,
st
ub
loa
de
d
dela
y
li
nes
and
dif
fer
e
nt
ty
pes
of sl
otted
confi
gurati
on
of ele
m
ents [
5
-
9].
The
ref
le
ct
io
n
phase
of
t
he
el
e
m
ents
is
de
sired
t
o
acq
uir
e
a
ra
ng
e
of
360º
a
nd
it
is
a
n
esse
ntial
requirem
ent o
f
r
eflect
arr
ay
de
sign. An ins
uff
ic
ie
nt r
an
ge
m
ay
r
esult i
n
ph
ase error
s
on the array
thu
s
r
esulti
ng
in the d
e
gr
a
de
d
ra
diati
on
p
e
r
form
ance.
Ano
ther
im
po
rtant p
aram
et
er f
or
ra
diati
on
perfor
m
ance o
f
re
flect
arr
ay
is
the
ref
le
ct
ion
phase
slo
pe.
A
ra
pid
ly
changin
g
ref
le
ct
io
n
ph
ase
re
su
lt
s
in
high
re
flect
ion
ph
a
se
sensi
ti
vity
.
Th
us
if
the
ref
l
ect
ion
phase
se
ns
it
ivit
y
is
hig
her
tha
n
the
et
chin
g
tolera
nc
e
then
the
phas
e
err
ors
ca
nnot
no
t
be
Evaluation Warning : The document was created with Spire.PDF for Python.
IS
S
N
:
2502
-
4752
Ind
on
esi
a
n
J
E
le
c Eng &
Co
m
p
Sci,
Vo
l.
1
3
, N
o.
2
,
Fe
bru
ary
201
9
:
7
7
3
–
7
7
8
774
neg
le
ct
e
d
an
d
m
ay
resu
lt
in
perform
ance
de
gr
a
datio
n.
T
he
ref
le
ct
io
n
ph
ase
range
a
nd
the
gradie
nt
of
curve
are
directl
y
relat
ed
to
each
oth
e
r,
increa
sing
the
ra
nge
will
increase
the
phase
sensi
ti
vity
and
vice
ver
sa
.
Anothe
r
te
ch
ni
qu
e
us
e
d
f
or
im
pr
ov
in
g
the
ph
a
se
ra
ng
e
is
us
in
g
m
ulti
-
la
yer
co
nf
i
g
urat
io
ns
or
du
al
resonan
c
e
el
e
m
ents
[1
0
-
14]
.
H
ow
e
ve
r
th
e
us
e
of
m
ulti
ple
la
ye
r
structu
res
pose
desig
n
an
d
fa
bri
cat
ion
c
halle
nges,
wh
il
e
sing
le
lay
er
du
al
b
an
d res
on
a
nce c
onfig
ur
at
i
on
s
inc
rease
phasi
ng c
om
plexity
at bo
t
h
t
he
r
es
on
a
nces
.
The
pe
rfor
m
ance
of
t
he
re
flec
ta
rr
ay
is
highl
y
depen
de
nt
on
th
e
el
ect
rical
pro
per
ti
es
of
t
he
s
ubstrat
e
m
at
erial
.
Su
bs
t
rate
m
at
erial
s
with
lo
wer
diele
ct
ric
per
m
i
tt
i
vity
are
m
or
e
desira
ble
due
to
ef
fici
ent
rad
i
at
ion
pro
per
ti
es
[
15
]
.
A
dv
a
nces
i
n
m
at
erial
te
chn
ologies
has
bro
ught
in
ne
w
an
d
ve
rsati
le
m
a
t
erial
s
to
en
ha
nc
e
the
diele
ct
ric
per
f
or
m
ances
for
r
eflect
arr
ay
ant
enn
a
s.
I
nnovat
ive
m
at
erial
s
with
la
te
st
m
a
nufactu
rin
g
te
chn
i
qu
e
s
are
pro
duci
ng
eff
ic
ie
nt
re
fle
ct
arr
ay
ante
nna
desig
ns
for
fu
t
ur
e
c
omm
u
nicat
ion
syst
e
m
s
[1
6,
17]
.
Be
sid
es
us
in
g
c
onve
ntion
al
m
at
erial
for
re
flect
arra
y
desig
ns
,
re
searche
rs
ha
ve
repo
rted
dif
fer
e
nt
in
organi
c
an
d
orga
nic
m
at
eri
al
s
su
ch
as
us
i
ng
li
quid
cryst
al
s
and
te
xtil
e
base
d
orga
nic
m
at
erial
s
to
acqu
i
re
tun
a
bili
ty
and
broa
db
a
nd fre
quency
be
hav
i
or [18
-
21]
.
I
n
al
l
the
sta
te
d
te
chn
i
ques
and
m
et
ho
ds
th
e
ref
le
ct
ion
phase
rem
ai
ns
on
e
of
the
key
con
ce
r
ns
in
te
rm
s
of
it
s
ra
nge
a
nd
gra
dien
t
to
achie
ve
a
dm
irable
pe
rform
ances.
T
his
a
rtic
le
discusse
s
the
int
rod
uctio
n
of
a
novel
orga
nic
diele
ct
ric
substrat
e
m
a
te
rial
fo
r
ref
le
ct
a
rr
ay
anten
na
to
achieve
br
oadba
nd
beh
a
vior.
It
discusse
s
the
eff
ect
s
of
us
ing
high
los
s
diele
ct
ric
su
bs
trat
e
m
at
erial
s
on
ref
le
ct
io
n
ph
ase
of
in
di
vid
ual
ref
le
ct
ar
ray
ele
m
ents.
This
arti
cl
es
pr
esen
ts
the
diele
ct
ri
c
m
at
erial
char
act
erizat
ion
r
esults
of
a
propo
s
e
d
su
bst
rate,
the
s
i
m
ulati
on
res
ults
al
ong
with
a
thoro
ugh
disc
us
sio
n
ov
e
r
th
e
ph
a
se
dist
or
t
ion
beh
a
vi
or
.
I
n
the
end, m
easur
em
ent r
es
ults
of
unit
r
eflect
ar
ray
ele
m
ents em
b
edd
e
d o
n pro
pose
d
s
ub
st
rate
are
pr
ese
nted
.
2.
ORGA
NIC DIE
LE
CTRIC
SU
BST
RA
TE
M
ATERI
AL
2.1.
Material
Comp
os
iti
on
The
pro
po
se
d
diele
ct
ric
substrat
e
m
at
eri
al
was
de
rive
d
f
ro
m
recyc
le
s
orga
nic
m
at
erial
s.
Th
e
com
po
sit
ion
of
the
pr
opos
e
d
pap
e
r
s
ubstrat
e
was
ca
refull
y
co
ntro
ll
e
d
to
acqu
i
re
s
uitable
diele
ct
ric
m
a
te
rial
pro
per
ti
es. T
he
p
a
p
er
is com
po
se
d of
t
wo m
a
j
or c
onsti
tuents
as stat
ed bel
ow:
1.
Re
cy
cl
ed
Ca
tron Pa
per (
75
%)
2.
Ba
nan
a
P
ulp
(
25 %)
The
recyc
le
d
carto
n
pap
e
r
s
erv
es
as
the
m
ai
n
com
po
ne
nt
w
hile
the
ba
nan
a
pulp
act
s
as
bi
ndin
g
m
edium
fo
r
th
e
m
ixtur
e
pa
rtic
le
s
du
e
t
o
it
s
fibro
us
natur
e
.
The
sam
ples
of
t
he
pa
per
s
ub
st
rate
we
re
passe
d
thr
ough
dif
fere
nt
heati
ng
an
d
dry
ing
sta
ge
s
in
orde
r
to
r
e
m
ov
e
any
m
oistur
e
c
onte
nt
that
m
igh
t
affe
ct
the
char
act
e
rizat
ion
resu
lt
s.
2.2
.
Charac
t
eri
z
at
ion
Resu
lts
The
pro
po
s
ed
diele
ct
ric
m
a
ter
ia
ls
were
ch
ar
act
erized
f
or
t
he
el
ect
rical
pr
op
e
rtie
s
usi
ng
a
broa
dban
d
m
at
erial
char
act
erizat
ion
te
chn
i
qu
e
s
base
d
on
pr
ob
e
pr
i
nciple.
T
he
pr
ob
e
a
nd
t
he
m
at
erial
un
der
te
st
are
bro
ught
in
ti
ght
co
ntact
a
nd
the
pro
be
m
e
asur
e
the
c
ha
nges
t
he
in
the
fr
i
ng
i
ng
el
ect
ro
m
agn
et
ic
fie
lds.
A
Sp
ea
g
3.5
m
m
diele
ct
ric
pro
be
with
a
n
analy
sis
range
of
0.2
–
20
GH
z
wa
s
us
e
d
f
or
cha
r
act
eri
zat
ion
over
the
X
–
band. T
he results
of m
at
e
rial
ch
ar
act
erizat
ion
a
re
pr
ese
nted
i
n
Fi
gure
1.
The result
s s
ho
w
the
va
riat
ion of
t
he rel
at
ive
diele
ct
ric p
erm
it
ti
vity
(
εr)
and
the los
s
tan
ge
nt (
ta
nδ)
of
the
pr
opos
e
d
m
at
erial
ov
er
the
band
of
i
nterest.
Ma
te
ri
al
c
har
act
erizat
io
n
sho
ws
th
at
the
substrat
e
pro
vi
des
a
m
ean
diele
ct
ric
per
m
it
ti
vit
y
of
1.6
3
al
on
g
with
a
diele
ct
ric
loss
ta
nge
nt
of
0.0
48
at
X
–
ba
nd
f
re
quency
op
e
rati
on.
Figure
1. Diel
e
ct
ric m
a
te
rial
ch
aracte
rizat
io
n res
ults
Evaluation Warning : The document was created with Spire.PDF for Python.
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on
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n
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c Eng &
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m
p
Sci
IS
S
N:
25
02
-
4752
A stu
dy of ref
le
ct
ion
phas
e
o
f
ref
le
ct
ar
ra
y
an
te
nnas
wi
th
high lo
ss
or
ga
nic
su
bst
ra
te
s
(
M.
Y.
I
sm
ail
)
775
3.
EFFE
CT OF
SU
BST
RA
TE
HEIGHT
O
N
R
EFL
ECTI
O
N
P
HAS
E
The
propose
d
pap
e
r
s
ubstrat
e
m
at
erial
per
form
ance
was
a
naly
zed
by
m
od
el
li
ng
a
unit
ref
le
ct
ar
ray
el
e
m
ent
in
a
f
ull
-
wa
ve
a
naly
sis
too
l.
Using
per
i
od
ic
c
onduct
ive
bounda
r
y
conditi
on
s
t
he
unit
el
em
en
t
was
si
m
ulate
d
withTE10
m
od
e
of
o
pe
rati
on.
Th
e
m
od
el
unde
r
con
si
der
at
io
n
is
sh
own
in
Figure
2.
The
m
od
el
consi
sts
of
a
re
ct
angular
patch
el
em
ent
on
a
diele
ct
ric
sla
b
gro
und
by
a
m
et
al
li
c
gr
ound
plane.
The
el
e
m
ent
is
placed
with
ve
rtic
al
boundar
i
es
are
m
agn
et
ic
wall
and
hor
iz
on
ta
l
boun
da
ri
es
are
el
ect
ric
wall
s.
The
i
nc
ident
el
ect
ric
fiel
d
ve
ct
or
is
al
so
s
how
n
in
Fig
ur
e
2.
T
hese
c
ondu
ct
ive
boun
da
ries
act
as
m
i
rror
s
for
the
ra
diate
d
el
ect
ro
m
agn
et
ic
ener
gy
an
d
the
el
e
m
ent
underg
oes
si
m
il
a
r
m
utu
al
coupl
ing
ef
fects
as
it
is
being
excit
ing
in
an
in
finite
a
rr
a
y of el
em
ents.
Figure
2. F
ull
-
wav
e
sim
ulati
o
n
m
od
el
of
unit
r
eflect
ar
ray el
e
m
ent
In
or
der
to
m
on
it
or
the
ef
fect
of
s
ubstrat
e
he
igh
t
over
the
ref
le
ct
io
n
ph
a
s
e
of
the
patch
el
e
m
ent
the
su
bst
rate
heig
ht
was
swe
pt
for
a
ran
ge
of
0.
3
–
1.5
m
m
.
T
he
si
m
ulati
on
r
esults
for
the
ref
le
ct
ion
loss
a
nd
the
ref
le
ct
io
n
phas
e are p
rese
nted
in
Figure 3
and Figure 4 r
es
pe
ct
ively
. Th
e r
eflect
ion
loss
c
urves
s
how
tha
t wit
h
the
va
riat
ion
of
substrat
e
heigh
t
from
0.
15
to
1
m
m
the
re
so
na
nt
f
re
qu
e
nc
y
sh
ifts
f
ro
m
11.58
to
10.
54
GH
z
.
More
ov
e
r
it
ca
n
be
no
ti
ced
f
r
om
Figu
re
3
t
ha
t
with
the
inc
rease
in
the
s
ubstrat
e
heig
ht
the
band
width
of
t
he
el
e
m
ent i
m
pr
oves.
Th
e
b
a
nd
width i
s calc
ul
at
ed
by m
ov
i
ng
10% a
bove
t
he
m
axi
m
u
m
l
os
s le
vel.
An
ab
norm
al
ity
in
the
tre
nd
can
be
noti
ced
in
the
Fig
ur
e
3
that
from
1
–
0.66
m
m
the
r
eflect
ion
l
os
s
curves
f
ollo
w
a
ty
pical
trend
of
inc
rease
d
loss
with
re
du
c
ed
substrat
e
he
igh
t.
Howe
ve
r
after
0.66
th
e
loss
sta
rts
to
decre
ase
agai
n.
Thi
s
di
ver
si
on
f
rom
us
ual
tren
d
can
al
s
o
be
noti
ced
in
t
he
re
f
le
ct
ion
ph
ase
curves
wh
e
re
it
can
be
seen
t
hat
wit
h
the
dec
rease
in
the
substra
te
thickne
ss
f
r
om
1
–
0.6
6
m
m
the
gr
a
dient
of
the
ref
le
ct
io
n
ph
a
s
e
increases
sh
a
rp
ly
from
0.
23
–
0.59
º/M
Hz
.
Af
te
r
f
ur
t
her
decr
ease
in
the
su
bs
trat
e
hei
ght
the
ph
a
se
cu
rv
e
s
ho
w
a
n
ab
norm
al
beh
a
vior
w
he
re
they
can
not
be
unw
rappe
d
to
no
rm
al
ph
ase
range.
T
his
m
igh
t
be
ha
ppeni
ng
du
e
t
o
inc
rease
in
the
diele
ct
r
ic
loss
too
m
uch
that
the
ref
l
ect
ion
phase
is
no
l
onge
r
f
ollow
i
ng
the
ge
ne
ric
tre
nd.
T
hus
a
li
m
i
t
is
to
be
def
in
ed
for
the
s
ub
s
trat
e
heig
ht
to
achieve
fruit
f
ul
ref
le
ct
io
n
ph
a
se
an
d
ref
le
ct
io
n
los
s
resu
lt
s.
Figure
3. Re
fle
ct
ion
lo
ss c
omparis
on for va
r
ia
ble
su
bst
rate
heig
ht
s
Figure
4. Re
fle
ct
ion
ph
a
se c
om
par
ison
for v
ariable
su
bst
rate
heig
ht
s
Evaluation Warning : The document was created with Spire.PDF for Python.
IS
S
N
:
2502
-
4752
Ind
on
esi
a
n
J
E
le
c Eng &
Co
m
p
Sci,
Vo
l.
1
3
, N
o.
2
,
Fe
bru
ary
201
9
:
7
7
3
–
7
7
8
776
4.
MEASU
REM
ENTS
AND R
ESULT
S
Af
te
r
the
cha
ra
ct
erizat
ion
of
t
he
orga
nic
s
ubstrat
e
m
at
erial
and
ver
ific
at
io
n
of
the
sim
ula
ti
on
desig
n,
validat
io
n
of
resu
lt
s
was
done
by
fabrica
ti
on
of
un
it
ref
le
ct
ar
ray
el
e
m
ents
on
pr
opos
e
d
substr
at
e.
The
fabrica
ti
on
w
as
carrie
d
ou
t
us
in
g
ad
he
sive
co
pper
t
ape.
Scat
te
ri
ng
pa
ram
et
er
m
easur
em
ents
wer
e
perform
ance
usi
ng
a
n
X
-
ba
nd
ta
pe
red
wa
ve
gu
i
de.
T
he
fa
br
ic
at
ed
sam
pl
es
an
d
the
c
om
ple
te
m
easur
e
m
ent
set
up are sh
ow
n
in
Fig
ure
5.
(a
)
(b)
Figure
5. Fa
br
i
cat
ion
a
nd m
ea
su
rem
ent (
a)
F
abr
ic
at
ed
sam
m
ples (
b)
C
omplet
e scat
te
rin
g pa
ram
te
rs
m
easur
em
ent setup
Figure
5(
a
)
shows
t
he
fa
bri
cat
ed
sam
ples
on
pro
posed
s
ub
st
rate
m
at
eri
al
.
Mult
iple
sam
ples
wer
e
fabrica
te
d
an
d
te
ste
d
to
achieve
rep
eat
a
bili
ty
of
resu
lt
s.
More
over
the
fa
bri
cat
ed
el
e
m
ents
wer
e
m
easure
d
for
their
fa
bri
cat
ion
tole
ran
ces
an
d
the
dif
fere
nc
es
in
the
dim
e
ns
io
n
wer
e
inc
orp
or
at
ed
in
t
he
sim
ulatio
n
m
od
el
s
.
The
set
up pres
ented
in Fi
gure
5
(
b)
c
on
sist
s of a
wav
e
guide
si
m
ulator
at
ta
ched
to
a R
odhe
&
Schwarz
14 G
Hz
vecto
r
net
work
a
naly
zer
via
a
coax
ia
l
cable
.
The
scat
te
rin
g
par
am
et
ers
we
re
rec
orde
d
an
d
the
n
a
com
par
iso
n
was dra
w
n between
the
sim
ul
at
ed
an
d
t
he
m
easur
e
d res
ults.
The
m
easur
e
d
an
d
sim
ulated
re
su
lt
s
of
unit
ref
le
ct
ar
ray
el
e
m
ents
on
pro
po
se
d
orga
nic
substrat
e
m
at
erial
ar
e
presented
i
n
Fig
ur
e
6.
The
res
ults
pr
e
sente
d
in
Fig
ur
e
6
s
how
a
go
od
a
gree
m
ent
betwee
n
th
e
si
m
ulate
d
an
d
the
m
easur
ed
res
ults.
T
he
r
eflect
ion
l
os
s
curves
s
how
a
res
on
a
nce
at
9.92
G
Hz
w
hile
the
si
m
ulate
d
m
odel
sh
ows
a
res
on
a
nce
at
9.9
8
GH
z
.
The
si
m
ula
te
d
ref
le
c
ti
on
loss
c
urve
s
show
a
m
axim
u
m
ref
le
ct
io
n
loss
of
-
4.3
4
dB
w
hi
le
the
m
easur
ed
cu
rv
e
s
how
s
a
loss
of
-
8.24
dB.
T
his
incre
ase
in
the
re
flect
io
n
loss
m
igh
t
be
du
e
to
the
m
easur
em
ent
set
up
lo
sses
s
uc
h
as
inse
rtion
lo
ss
an
d
co
nnect
or
losses
.
T
he
ba
nd
wid
th
of
t
he
re
flect
ion
los
s
c
urves
is
m
easur
ed
as
10%
ba
ndwidt
h.
T
he
r
esults
show
ba
ndwidt
hs
of
682
a
nd
355
M
Hz fo
r
si
m
ula
te
d
an
d
m
easur
e
d reflect
i
on loss
cur
ves respecti
vely
.
The
ref
le
ct
io
n
ph
a
se
cu
r
ves
presente
d
in
Fig
ur
e
7
de
pict
a
cl
os
e
tre
nd
bet
ween
th
e
m
easur
e
d
a
nd
the
si
m
ulate
d
cu
rves.
It
can
be
noti
ced
t
hat
the
cu
rv
e
s
s
how
m
axi
m
u
m
gr
a
dient
at
t
he
re
so
na
nce
point
of
the
el
e
m
ent
and
t
he
phase
gr
a
die
nt
dec
reases
gr
adu
al
ly
be
f
or
e
and
after
the
re
so
na
nce
point.
The
ref
le
ct
io
n
ph
a
se
curves
dep
ic
t
r
eflect
io
n
ph
ase
gr
a
dients
of
0.1
0
an
d
0.14
º/
MHz
f
or
sim
ulate
d
an
d
m
eas
ur
e
d
phase
c
urves
.
The
phase
c
urves
co
ve
r
phas
e
ranges
of
24
3º
a
nd
301º
for
si
m
ulate
d
and
m
easur
ed
resul
ts.
It
can
be
noti
ced
that
the
m
eas
ur
e
d
ref
le
ct
io
n
ph
ase
cu
rv
e
s
are
gr
eat
er
th
an
the
si
m
u
la
t
ed
ranges
.
Thi
s
occurs
due
to
the
increase i
n
t
he l
os
s
of
t
he refl
ect
arr
ay
elem
e
nt since
incre
a
se in l
os
s
res
ults in a
w
i
der
ph
ase ra
ng
e
.
The
re
flect
arr
a
y
un
it
el
em
ent
s
ab
ov
e
t
he
pr
opos
e
d
s
ubstra
te
s
sh
ow
cl
ose
agr
eem
ent
be
tween
the
m
easur
ed
a
nd
the
si
m
u
la
te
d
resu
lt
s.
The
ri
pple
d
prese
nt
in
the
m
easur
ed
resu
lt
s
of
ref
le
ct
ion
loss
cu
r
ve
s
are
du
e
to
dev
ia
ti
on
of
wa
ve
gu
i
de
si
m
ulator
from
it
s
ideal
beh
avi
or.
More
ov
e
r
the
prese
nted
res
ults
show
tha
t
with
lo
w
diele
ct
ric
per
m
it
t
ivit
y
m
a
te
rial
s
a
broa
db
a
nd
f
re
qu
e
ncy
res
ponse
can
be
achi
eved.
H
oweve
r
this
com
es
at
a
cos
t
of
ref
le
ct
io
n
ph
a
se
ra
nge
a
nd
the
gradie
nt
of
t
he
ph
a
se
c
urve.
M
or
e
ove
r
w
hile
fa
br
ic
a
ti
on
of
the
ref
le
ct
arr
a
y
antenn
a
a
m
ini
m
u
m
heigh
t
of
the
sub
strat
e
sh
ould
be
m
a
intai
ned
to
achieve
accurat
e
scat
te
ring
pa
ra
m
et
er r
esults.
Evaluation Warning : The document was created with Spire.PDF for Python.
Ind
on
esi
a
n
J
E
le
c Eng &
Co
m
p
Sci
IS
S
N:
25
02
-
4752
A stu
dy of ref
le
ct
ion
phas
e
o
f
ref
le
ct
ar
ra
y
an
te
nnas
wi
th
high lo
ss
or
ga
nic
su
bst
ra
te
s
(
M.
Y.
I
sm
ail
)
777
Figure
6. Re
fle
ct
ion
lo
ss c
urv
es for
m
easur
ed
a
nd
si
m
ulate
d
res
ults com
par
iso
n
Figure
7. Com
par
is
on of m
easur
e
d
a
nd sim
ulate
d
ref
le
ct
io
n ph
as
e cu
rv
es
5.
CONCL
US
I
O
N
Novel
ref
le
ct
ar
ray
ante
nn
a
el
e
m
ents
base
d
on
orga
nic
s
ub
st
rate
m
at
erial
has
bee
n
presen
te
d
f
or
X
–
band
f
reque
nc
y
op
erati
on.
T
he
cha
racteri
z
at
ion
of
the
m
at
erial
sh
ows
excell
ent
diele
ct
ric
pr
oper
ti
es
for
broa
db
a
nd
f
re
qu
e
ncy
op
e
rati
on.
T
he
a
naly
s
is
of
the
ef
fect
of
s
ubstrat
e
he
igh
t
var
ia
ti
on
over
the
s
cat
te
rin
g
par
am
et
ers
sho
w
that
durin
g
t
he
desig
ning
of
the
ref
le
ct
ar
r
ay
un
it
el
em
ents
a
m
ini
m
u
m
su
bst
rate
he
ig
ht
m
us
t
be
m
ai
ntained
to
ac
quire
s
ui
ta
ble
ref
le
ct
io
n
ph
a
se
c
urve
s.
Un
it
re
flect
arr
ay
el
em
ents
fa
br
ic
at
ed
ov
er
the
pro
p
os
e
d
subs
trat
e
m
at
eria
l
sh
ow
broa
dba
nd
f
re
qu
e
ncy
beh
a
vior
of
355
MHz
ba
nd
width,
al
ong
with
a
n
adequate
phase
r
a
ng
e
covera
ge
of
301º.
ACKN
OWLE
DGE
MENTS
The
w
ork
was
f
unde
d
by
G
PPS
Gr
a
nt
(VOT
466),
R
ACE
G
ran
t
(
VOT
1119)
an
d
Re
s
earch
F
un
d
UTH
M
aw
a
r
de
d by Mi
nis
try
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