Int
ern
at
i
onal
Journ
al of Ele
ctrical
an
d
Co
mput
er
En
gin
eeri
ng
(IJ
E
C
E)
Vo
l.
9
, No
.
6
,
Decem
ber
201
9
, p
p.
5628
~
5635
IS
S
N:
20
88
-
8708
,
DOI: 10
.11
591/
ijece
.
v
9
i
6
.
pp5628
-
56
35
5628
Journ
al
h
om
e
page
:
http:
//
ia
es
core
.c
om/
journa
ls
/i
ndex.
ph
p/IJECE
Experim
ent s
tud
y of usin
g
p
ar
allel
plate s
en
sor for the
det
ec
tion
of c
ondu
ctive
m
aterial
N.
L
ok
m
anul
ha
kim
,
W.
N
. Abd
Rashid
,
N.
H. Hussi
n
, M
. F
. Mu
khta
r
Depa
rtment
o
f
E
le
c
troni
c
and
Co
m
pute
r
Engi
n
ee
r
ing
T
ec
hnolog
y
,
Univer
siti
Te
kn
i
kal
Ma
lay
sia
Me
la
ka
,
Ma
lay
sia
Art
ic
le
In
f
o
ABSTR
A
CT
Art
ic
le
history:
Re
cei
ved
J
a
n
11
, 2
01
9
Re
vised
Ju
l
2
3
,
201
9
Accepte
d
J
ul
30
, 2
01
9
Gold
is
one
of
the
pre
ci
ous
m
et
al
tha
t
has
a
good
demand
m
ark
et
in
the
world.
Due
to
tha
t,
m
an
y
fr
aud
ca
ses
happen
espe
ci
a
lly
wh
en
dea
li
n
g
with
the
je
welr
y.
Thus,
ver
if
y
in
g
gold
cont
ent
i
s
important
and
nee
d
to
be
done
with
the
b
est
t
ec
hniqu
es.
Thi
s
pap
er
in
tro
duce
s
an
EC
T
s
ensor
of
two
par
allel
p
lates
u
sing
square
elec
t
rode
s.
Thi
s
sens
or
was
inve
stigated
e
it
her
it
ca
pab
le
to
d
etec
t
the
conduc
t
ive
m
at
eri
a
ls;
Gold
.
A
complet
e
ar
c
hit
e
ct
ure
of
a
s
y
st
em
is
d
esi
gned
which
in
clude
th
e
sensor
design,
the
m
ain
con
tro
ll
er
unit
design
and
gra
phic
user
in
t
erf
ace
(GU
I).
A
two
-
pla
te
EC
T
sensor
with
2
el
ectrode
s
eac
h
pla
te
will
fab
ric
a
te
on
t
he
pr
int
ed
ci
r
cuit
boar
d
(PCB
).
Thi
s
expe
r
iment
will
implement
sing
l
e
ele
ct
rode
excitatio
n
m
et
hod.
W
hen
el
ectrode
1
was
inj
ec
t
ed
b
y
th
e
source
,
el
e
ct
rode
s
othe
r
than
el
ectrod
e
1
are
at
the
virt
ual
e
art
h
p
ote
ntial
or
call
ed
as
de
tecti
n
g
el
e
ct
rod
e
.
Inde
pende
n
t
c
ap
ac
i
ta
nc
e
m
ea
sur
ements
were
ta
k
en
from
the
three
elec
trode
s
with
diff
ere
nt
e
xci
t
at
ion
fre
qu
e
nc
y
.
The
fre
qu
e
nc
y
wil
l
var
y
fr
om
50Hz
to
9.
5MH
z.
Th
e
ex
per
iment
resul
t
show
s
tha
t
the
two
par
allel
p
la
t
e
ECT
sensor
is a
bl
e
to
m
ea
sur
e
th
e conduc
t
ive
m
at
eri
a
ls.
Ke
yw
or
d
s
:
Cond
uctive m
a
te
rial
Ele
ct
rical
c
apa
ci
ta
nce
Go
l
d
Parall
el
p
la
te
s
ens
or
Square
elec
tro
de
Tom
og
ra
ph
y
Copyright
©
201
9
Instit
ut
e
o
f Ad
vanc
ed
Engi
n
ee
r
ing
and
S
cienc
e
.
Al
l
rights re
serv
ed
.
Corres
pond
in
g
Aut
h
or
:
Nor Hafiza
h
B
inti
H
ussi
n,
Dep
a
rtm
ent o
f El
ect
ric Engin
eerin
g
Tec
hnol
og
y,
Un
i
ver
sit
i Te
knikal M
al
ay
sia
Mel
aka,
Hang T
ua
h
Jay
a, 76
100 D
ur
ia
n
T
unggal
,
Me
l
aka
,
Mal
a
y
s
ia
.
Em
a
il
:
no
r
haf
i
zah.
hussin
@u
t
e
m
.ed
u.
m
y
1.
INTROD
U
CTION
Go
l
d
is
the
ye
ll
ow
pr
eci
ous
m
e
ta
l
that
has
been
use
d
in
m
any
app
li
cat
io
ns
li
ke
s
m
edici
ne,
el
ect
ro
nics
,
j
e
welry,
i
nv
est
m
ent,
a
nd
ot
hers
.
T
hu
s
,
go
l
d
is
on
e
of
t
he
c
omm
od
it
ie
s
wh
ic
h
has
high
de
m
and
in
the
global
m
ar
ket
especial
ly
in
j
e
welry
in
dustrie
s.
More
t
ha
n
75%
of
gol
d
outp
ut
was
proces
sed
int
o
je
welry
.
The
m
isrepr
es
entat
ion
of
gold
c
on
te
nt
has
been
a
s
ource
of
co
nce
rn
at
a
ll
le
vels
of
the
industries
.
I
n
ot
her
t
o
secur
e
t
he
pu
r
it
y
o
f
gold
a
nd
to
protect
the
retai
le
r
a
nd
co
nsum
er
from
fr
aud,
the
detect
ion
of
go
l
d
is
ver
y i
m
po
rta
nt
.
Ther
e
a
re
a
nu
m
ber
of
te
ch
niq
ue
s
ha
ve
ev
ol
ved
over
the
y
ears
f
or
deter
m
ining
gold
c
on
te
nt
ei
ther
us
in
g
the
a
ncie
nt
or
m
od
er
n
te
chn
i
qu
e
.
Cu
pe
ll
at
ion
(f
ir
e
a
ssay
)
[
1]
is
on
e
of
t
he
tra
diti
on
al
m
et
ho
ds
t
hat
has
been
us
e
d
wor
ldwid
e
f
or
go
l
d
dete
rm
inati
o
n
an
d
it
sti
ll
re
m
ai
ns
the
m
os
t
accu
rate
m
et
hod.Hen
ce
,
i
t
was
ac
cepted to
be
com
e
the standa
rd
tech
nique to b
e com
par
e
d and
cove
red
i
n
the I
S
O
1142
6:1993
[
2]
.
H
oweve
r,
this
proce
dure
is
a
non
-
dest
ru
ct
ive
m
et
hod
beca
us
e
sa
m
ple
being
de
stroyed
a
s
it
sh
ould
be
m
el
t
ed
[
3]
.
Fo
r
the
m
od
e
r
n
te
ch
nique,
th
ere
are
fe
w
a
na
ly
ti
cal
m
et
ho
ds
that
bee
n
pract
ic
e
fo
r
assa
y
go
l
d
s
uch
as
X
-
ray
flu
or
esce
nce
(
XRF).
XRF
i
s
the
m
os
t
popula
r
nucl
ear
m
e
tho
d
that
is
us
e
d
t
o
var
ie
d
go
l
d
but
this
te
chn
iq
ue
ha
d
lim
it
ed
to
te
stin
g
the
s
urface
and
it
s
abili
ty
about
the
inne
r
detai
ls
of
te
st
sa
m
ples
rem
ai
ns
unknow
n
[
4]
,
[5]
.
T
he
oth
e
r
te
chn
iq
ues
tha
t
us
ually
pract
ic
for
va
rifyi
ng
go
l
d
is
I
nduc
ti
ve
Co
up
le
P
la
s
m
a
(I
CP
)
[6
,
7]
,
A
tom
ic
Ab
s
orption
Sp
ect
ro
m
etr
y
(AAS
)
[8
,
9]
,
Com
pu
te
d
T
om
og
ra
ph
y,
a
nd
the
la
te
st
inve
ntio
n
is usin
g D
ual E
nergy
of
Mi
cr
o
-
Com
pu
te
d To
m
og
raphy.
Evaluation Warning : The document was created with Spire.PDF for Python.
In
t J
Elec
&
C
om
p
En
g
IS
S
N:
20
88
-
8708
Experime
nt st
udy
of usi
ng
pa
r
allel
p
late se
nsor f
or
the
detec
ti
on
of con
duct
iv
e m
ateri
al (N
. Lokm
anul
ha
k
im)
5629
Each
te
c
hn
i
qu
e
ha
ve
t
heir
own
ad
va
ntages
,
ne
ve
rtheless
f
or
an
ideal
m
eth
od
of
assay
in
g
go
l
d
c
oul
d
consi
der
fe
w
facto
rs
s
uc
h
as
reli
able,
si
m
ple,
ra
pid
,
i
nexpe
ns
iv
e,
an
d
al
s
o
non
-
dest
ru
ct
iv
e
[10]
.
Non
-
destr
uctive
te
st
(N
DT
)
is
on
e
of
the
i
m
po
rtant
fact
or
s
f
or
ens
ur
i
ng
that
the
fine
ness
of
gold
c
an
be
m
ai
ntained
[11
,
12]
.
M
or
e
recent
at
te
ntion
has
fo
c
us
e
d
on
the
a
pp
li
cat
ion
of
Ele
ct
rical
Ca
pacit
ance
Tom
og
ra
ph
y
(
ECT)
te
ch
niqu
e
to
exam
ine
t
he
co
ntents
of
go
l
d
j
e
well
ery
.
Hisyam
et
a
l
(20
16),
hav
e
st
ud
ie
d
on
de
velo
ping
a
new
te
c
hniqu
e
us
in
g
th
e
par
al
le
l
plate
Ele
ct
rical
C
apacit
ance
T
om
og
raphy
to
chec
k
the
co
nte
nt
of
go
l
d
bar
w
hich
prom
isi
ng
re
s
ult
to
as
say
the
purity
an
d
fin
eness
of
go
l
d
[
13
]
.
ECT
was
know
n
as
one
of
the
m
os
t
dev
el
op
e
d
tom
og
ra
phic
m
od
al
it
ie
s
a
mo
ng
m
any
indu
stria
l
process
t
om
og
ra
ph
y
te
c
hn
i
qu
e
s
This
is
beca
use
,
ECT
te
ch
niq
ue
s
a
re
non
-
r
adioacti
ve
,
no
n
-
i
ntrusive
a
nd
non
-
in
vasive
,
hi
gh
im
aging
sp
e
e
d
and
lo
w
c
os
t
[
14
,
15]
.
Ot
her
than
that,
EC
T
al
so
has
im
plem
ent
in
m
a
ny
in
dustria
l
a
pp
li
cat
io
ns
,
i
nc
lud
in
g
the
fl
ow
m
easur
em
ent
in
the
oil
pip
el
i
nes
[
16
,
17]
,
wet
ga
s
sepa
rato
rs,
flu
idize
d
bed
s
[18
,
19]
,
pne
um
at
ic
conveyo
rs
a
nd
gas/s
olids
cy
cl
on
es
[
20
,
21]
.
This
s
how
n
that
ECT
wa
s
a
m
at
ur
e
te
chn
i
qu
e
an
d
it
can
be
app
li
ed
in
var
i
ou
s
a
pp
li
cat
io
n.
T
her
e
fore,
the
wr
it
er
wou
ld
li
ke
to
purpose
to
us
e
the
ECT
te
chn
iq
ue
f
or
ver
ify
in
g
t
he
cond
uctive
m
at
erial
s.
The
ob
j
ect
ive
of
this
pa
per
is
to
i
de
ntify
the
e
ff
e
ct
iveness
of
usi
ng
a
par
al
le
l
plate
s
ens
or
m
et
hod
for
the
m
easurem
ent
of
the
c
ond
uctive
m
ater
ia
l
su
c
h
as
gold
ba
r,
al
um
i
niu
m
,
and
ir
on.
2.
FUND
AM
E
N
TAL OF
ECT
The
ba
sic
co
ncep
t
of
ECT
is
to
m
easure
var
ia
ti
ons
of
capac
it
ance
betwee
n
el
ect
rode
pair
s
,
then
it
will
ge
ner
at
e
a
c
ro
s
s
-
sect
io
nal
i
m
age.
T
his
cr
oss
-
sect
io
nal
i
m
age
will
re
pr
e
sent
the
per
m
i
tt
ivit
y
distrib
ution
an
d
m
at
erial
d
ist
r
ibu
ti
on
[22
-
24]
. F
ig
ur
e
1
desc
ribes
the
w
ho
le
syst
e
m
o
f
ECT w
hich
is c
onsist
of
three m
ai
n
unit
s:
T
he
se
nsor
w
it
h
m
ulti
-
el
ect
ro
des,
T
he
ca
pacit
anc
e m
easur
ing
ci
rcu
it
, a
nd
A
c
om
pu
te
r
f
or
hardw
a
re c
on
trol a
nd d
at
a
pr
ocessin
g, inclu
ding im
age r
ec
on
st
ru
ct
io
n.
Figure
1. O
verview
of the
EC
T
syst
em
Figure
1
s
how
s
a
se
gm
ented
ECT
syst
em
with
a
se
nsor
com
pr
isi
ng
of
6
el
ect
r
od
es
,
a
capaci
ta
nce
m
easur
em
ent
ci
rcu
it
,
a
cent
ral
con
t
ro
l
un
it
,
and
a
co
ntro
l
PC.
T
he
el
ect
ro
de
wh
i
ch
is
norm
al
l
y
bu
il
t
from
a
cond
uc
ti
ve
plate
act
s
as
t
he
se
ns
i
ng
s
urface
t
ha
t
has
a
direct
co
nnect
ion
to
the
m
easur
in
g
a
rea.
The
el
ect
r
od
e
pro
vid
es
e
xc
it
at
ion
sign
al
s
and
co
nverts
capaci
ta
nces
into
vo
lt
age
si
gn
al
s,
w
hi
ch
ar
e
then
c
onditi
oned
an
d
dig
it
iz
ed
f
or
data
acq
uisit
ion
.
The
ca
pacit
an
ce
m
easur
ing
ci
rcu
it
,
known
a
s
the
sign
al
c
onditi
on
in
g
ci
rc
ui
t,
is
us
ed
to
c
ollec
t
data
and
to
conve
rt
m
easur
em
ent
read
in
gs
into
di
giti
zed
resu
lt
s.
T
he
ce
ntral
co
ntr
ol
uni
t
synch
roniz
es
al
l
op
erati
ons
an
d
facil
it
ates
the
trans
fe
r
of
data
to
the
con
t
rol
PC.
T
he
c
on
trol
PC
recei
ves
t
he
m
easur
em
ent
rea
din
gs,
st
or
es
t
he
ac
quired
data,
a
nd
vis
ualiz
es
reconstr
ucted
im
ages.
Fo
r
ECT
syst
e
m
there
are
two
basic
pro
blem
s
so
-
cal
le
d
a
s
fo
r
w
ard
an
d
in
verse
prob
le
m
.
The
f
orwa
rd
pro
blem
is
to
de
te
rm
ine
inter
-
e
le
ct
ro
de
ca
paci
ta
nces
f
ro
m
the
per
m
it
t
ivit
y
distrib
ution
[25
,
26]
.
Wh
il
e
the
in
ve
rse
pro
blem
i
s
to
determ
ine
the
per
m
it
ti
vi
ty
distribu
ti
on
from
capaci
tan
ce
m
easur
em
ents.
Evaluation Warning : The document was created with Spire.PDF for Python.
IS
S
N
:
2088
-
8708
In
t J
Elec
&
C
om
p
En
g,
V
ol.
9
, N
o.
6
,
Dece
m
ber
201
9
:
562
8
-
563
5
5630
In
this
case,
t
he
auth
or
ch
ooses
to
use
finite
-
el
em
ent
m
et
ho
d
(
FEM
)
for
so
l
ving
the
forw
a
r
d
pro
blem
.
The rel
at
ion
s
hi
p betwee
n
ca
pa
ci
ta
nce and p
erm
i
tt
ivity distrib
ution can
b
e
expres
sed
as:
=
=
−
1
∬
(
,
)
∇
∅
(
,
)
Γ
(1)
Wh
e
re
is
t
he
pote
ntial
di
f
fer
e
nce
betwe
en
t
wo
el
ect
r
od
e
,
(
,
)
is
the
per
m
it
t
ivit
y
distribu
ti
on
in
the se
ns
in
g fiel
d,
∅
(
,
)
is t
he
potent
ia
l distri
bu
ti
on
and Γ i
s the
elec
tro
de
s
urface.
Eq
uation
(1)
c
an
be
sim
plifie
d
in
s
om
e
case
s.
For
e
xam
ple
,
f
or
a
n
ideal
pa
rall
el
–
plate
s
ens
or
with
a hom
og
ene
ous p
e
rm
i
tt
ivit
y dist
ribu
ti
on, it
be
com
es
=
(2)
Wh
e
re
is
the
per
m
it
t
ivit
y
of
vac
uum
(
8
.
84
10
−
12
),
is
the
relat
ive
pe
rm
i
tt
ivity
of
the
m
at
erial
insid
e
the
sens
or,
A
i
s
the
area
of
th
e
plate
s
and
d
is
the
distance
betwee
n
the
tw
o
plate
s.
E
qu
at
ion
(
2)
im
plies
su
ch
a sim
ple r
el
at
i
on
s
hi
p
that ca
pa
ci
ta
nce is pr
oport
io
nal to pe
rm
i
tt
ivity.
2.1.
E
le
ctro
de
sens
or
de
sign
ECT
sensors
a
re
form
ed
by
a
n
arr
ay
of
the
el
ect
ro
de
wh
ic
h
ty
pical
ly
con
sist
s
of
8,
12,
16
el
ect
r
od
es
in
the
ty
pical
ECT,
no
rm
all
y
the
el
ect
rod
es
are
a
ci
rcu
l
ar
s
hap
e
i
n
order
t
o
e
ncircle
the
ci
rc
ular
t
ype
of
pip
el
ines
.
A
ny
how,
in
s
om
e
sp
eci
fic
a
ppli
cat
ion
s
uc
h
as
industrial
bo
i
le
r,
s
qu
a
re
s
ha
pe
ECT
sens
or
a
re
need
e
d.
T
he
a
dv
a
ntage
of
t
he
square
s
hap
e
it
can
im
pr
ove
i
m
age
qual
it
y
i
n
the
ce
ntral
re
gion
c
om
par
ed
with
the
ci
rcu
la
r
se
ns
or
[27]
.
Alm
os
t
al
l
of
ECT
sens
or
s
is
fix
ed
a
nd
i
ns
ta
ll
ed
on
t
he
pip
el
ine
wit
h
an
enc
losin
g
sensing
a
rea.
T
hu
s
it
is
lim
it
e
d
to
s
om
e
app
li
cat
ion
that
has
irre
gu
la
r
s
hapes
an
d
open
se
ns
in
g
a
rea.
Th
eref
ore
for
this
ex
per
i
m
ent,
the
wr
it
er
will
us
e
squ
are
paral
le
l
plate
sensor
w
hich
al
lows
the
se
ns
ors
to
be
fix
es
an
d
assem
bled
ind
e
pende
ntly
b
y f
ollow
i
ng the
s
hap
e
of t
he
m
a
te
rial
test
ed.
In
this
stu
dy,
there
a
re
few
ke
y
issues
fo
r
de
sign
i
ng
the
E
CT
sensors
ne
ed
to
be
co
ns
id
ered.
First
ar
e
the
nu
m
ber
a
nd
le
ng
t
h
of
the
el
ect
ro
des
.
For
this
ex
per
im
e
nt,
4
el
ect
r
od
e
s
will
be
us
ed
.
The
le
ng
t
h
al
so
just
m
axi
m
u
m
21m
m
becau
se
f
ollow
the
m
at
e
rial
te
ste
d.
H
oweve
r,
Ya
ng
e
t
al
(
2010)
sta
te
d
t
hat
the
el
ect
rodes
cannot
be
to
o
s
hort
beca
us
e
of
the
li
m
i
t
in
the
reso
l
utio
n
of
the
capaci
ta
nc
e
m
easur
in
g
ci
rcu
it
s
a
nd
t
he
f
rin
ge
eff
ect
.
Sec
ond
is
the
value
of
the
sta
ndin
g
ca
pacit
ance.
T
he
re
ar
e
fe
w
fact
or
s
that
ca
n
i
nfl
uen
ce
the
val
u
e
of
sta
nd
i
ng
capac
it
ance
to
incl
ude
the
thick
nes
s
an
d
per
m
it
t
ivit
y
of
the
m
at
erial
,
the
distan
ce
betwee
n
t
w
o
plate
and an
gle of el
evati
on of the
par
al
le
l plat
e.
Othe
r
fact
or
s t
hat can
c
ause
s
ta
nd
in
g
ca
pacit
ance is eart
he
d scree
n
and drive
r gu
a
r
d
el
ect
r
od
e
s.
Fo
r
fa
bri
cat
ed
the
el
ect
r
ode
s,
the
m
at
erial
us
e
d
m
us
t
be
a
highly
co
nductive
m
at
e
rial
,
suc
h
as
coppe
r,
al
um
i
nu
m
,
sil
ver
,
s
te
el
,
tun
gs
te
n
or
ir
on.
Tab
le
1
sh
ows
a
com
par
ison
betwee
n
so
m
e
hig
h
cond
uctivit
y
m
at
erial
s.
Ther
ef
or
e
,
f
or
t
his
exp
e
rim
ent
wr
it
er
deci
de
to
fabrica
te
el
ect
rode
us
i
ng
c
oppe
r
a
s
the
m
at
erial
.
This
is
becau
s
e,
copper
ca
n
easi
ly
be
fo
un
d
on
any
Pr
int
ed
Boar
d
(P
C
B)
m
or
eo
ver
i
t
al
so
highly
conduct
ive m
at
erial
, ea
sy t
o be f
a
bri
cat
ed
an
d
al
s
o
l
ow c
os
t.
Table
1.
T
he
c
om
par
ison o
f
e
le
ct
ric
al
co
nduc
ti
vity
b
et
ween hig
h
c
onduct
i
vity
m
at
erial
s
Mater
i
al
Electr
i
cal Co
n
d
u
ctiv
ity
σ(S/
m
)
at
2
0
°
C
Silv
er
6
.30
x
1
0
7
Co
p
p
er
5
.98
x
1
0
7
Alu
m
in
u
m
3
.5x
1
0
7
Ir
o
n
1
.04
x
1
0
7
Zinc
1
.68
2
x
1
0
7
In
this
ex
pe
rim
ent,
two
sen
so
r
plate
s
will
be
placed
in
par
al
le
l.
Each
sens
or
c
on
sist
s
of
ei
ther
2
el
ect
ro
des
. T
he
d
esi
gn p
a
ram
e
te
rs
of t
he
se
nsors
are
sho
wn in
Fi
gure
2
.
The co
nf
i
gurati
on
s of the
se
ns
or
are:
Len
gth
of s
hieldin
g
la
ye
rs
a
nd
w
al
l:
21m
m
Ele
ct
ro
de
len
gt
h: se
ns
or
1= 1
8mm
Gap
bet
ween a
dj
ace
nt elec
tr
odes:
1mm
Ma
te
rial
of
s
hi
el
din
g l
ay
ers
a
nd elec
tro
de: C
oppe
r
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Experime
nt st
udy
of usi
ng
pa
r
allel
p
late se
nsor f
or
the
detec
ti
on
of con
duct
iv
e m
ateri
al (N
. Lokm
anul
ha
k
im)
5631
Figure
2. Se
nsor
w
it
h 4
elec
tr
od
e
s
2.2.
M
ain
co
nt
r
ol
unit
de
sign
The
sig
nal
c
onditi
onin
g
ci
rc
uit
consi
sts
of
few
par
ts;
a
capaci
ta
nce
m
easur
i
ng
ci
rcu
i
t,
a
m
plifie
r
ci
rcu
it
,
abs
olu
t
e
ci
rcu
it
,
low
pass
ci
rc
uit
an
d
al
so
a
nalo
g
to
di
gital
conve
rter.
At
the
fir
st
sta
ge,
a
sine
wave
vo
lt
age
V
i
is
s
upplied
from
the
functi
on
ge
ner
at
or
with
a
fr
e
quency
of
500
kHz
a
nd
a
m
plit
ud
e
5Vp
k
-
pk.
The
e
xcit
at
ion
volt
age
V
i
is
ap
plied
t
o
t
he
unkn
own
ca
pacit
ance
C
x
.
A
wide
ba
nd
width
O
p
-
Am
p,
with
feedbac
k
ca
pac
it
ance C
f
an
d f
eedb
ac
k resist
a
nce
R
f
c
onve
rts the c
urre
nt in
to an AC
volt
age, V
0
giv
e
n b
y:
=
+
1
(3)
The
an
gu
la
r
frequ
e
ncy
(ω)
is
from
s
ine
wave
so
urce.
The
n
the
capaci
ta
nc
e
feed
ba
ck
is
sel
ect
ed
to
be
do
m
inant
e
qu
a
ti
on
(3) becom
es:
=
−
(4)
This
AC sig
nal
is am
plifie
d
further by a
n AC
am
plifie
r
to ac
com
m
od
at
e a larg
e
r
a
ng
e
of c
apacit
anc
e
values
. F
i
gure
3
s
how
s
AC
-
ba
sed
ca
pacit
an
ce m
easur
em
e
nt circ
uit
.
Figure
3. AC
-
ba
sed
ca
pacit
an
ce m
easur
em
e
nt circ
uit
[
23
]
The
w
rite
r
ad
de
d
the
ap
plica
ti
on
of
a
bs
ol
ute
ci
rcu
it
for
pro
cesses
the
out
pu
t
vo
lt
age
t
o
be
eq
ual
t
o
the
in
pu
t
vo
lt
a
ge
re
ga
rd
le
ss
of
pola
rity
.
I
n
ot
her
words,
both
pola
riti
es
of
the
in
pu
t
si
gnal
produce
t
he
sam
e
po
la
rity
as
the
ou
t
pu
t
si
gnal
.
Lat
er
the
a
bsol
ute
val
u
e
ci
rc
ui
t
will
be
com
bin
e
d
with
the
first
order
lo
w
-
pass
filt
er
to
reduc
e
noise
a
nd
to
get
a
cl
ea
n
D
C
ou
t
put
f
ro
m
the
AC
in
pu
t
volt
age.
N
I
My
Ri
o
was
c
hose
n
as
the
m
ai
n
con
t
ro
ll
er
w
hich
will
synch
roni
ze
the
whole
op
e
rati
on
of
the
syst
em
.
More
over,
the
da
ta
in
an
a
nalo
g
f
orm
wh
ic
h
has
been
c
ollec
te
d
from
the
se
nsor
will
be
tra
ns
fe
rr
e
d
t
o
t
he
My
rio
w
hich
act
as
the
anal
og
to
dig
it
al
co
nv
e
rt
er
.
La
stl
y,
G
UI
was
bei
ng
interface
d
wi
th
the
c
ontr
oller
m
od
ule
t
o
record
the
analo
gue
inputs
an
d
cal
culat
e
the
avera
g
e
capaci
ta
nc
e
betwee
n
the
el
ect
ro
des
.
The
blo
c
k
diagra
m
in
Figure
4
s
hows
the
whole
pro
cess of t
he
EC
T
syst
em
.
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In
t J
Elec
&
C
om
p
En
g,
V
ol.
9
, N
o.
6
,
Dece
m
ber
201
9
:
562
8
-
563
5
5632
Figure
4. Bl
oc
k diag
ram
o
f
el
ect
rical
capacit
ance tom
ography syst
em
3.
RESU
LT
S
AND DI
SCUS
S
ION
The
ex
pe
rim
en
t
was
carrie
d
out
by
m
eans
of
an
ECT
syst
em
fo
r
m
easur
e
capaci
ta
nce
of
cond
uctive
m
at
erial
.
At
th
e
early
sta
ges
t
hr
ee
m
at
erial
s
wer
e
te
ste
d;
gold
ba
r,
ir
on,
a
nd
al
um
inium
.
The
ex
per
im
e
nt
wa
s
carried
ou
t
us
i
ng
a
2x2
ar
ray
of
el
ect
rodes:
el
ect
ro
de
1
(E
1),
el
e
ct
ro
de
2
(E2),
el
ect
rode
3
(E3)
and
el
e
ct
rode
4
(E
4)
.
T
he
dis
ta
nce
betwee
n
the
par
al
le
l
pla
te
s
is
fi
xed
to
1mm
.
The
m
ater
ia
l
will
be
pl
aced
in
the
m
i
dd
le
of
the
plate
s.
For
this
syst
e
m
,
the
tradit
io
nal
m
et
hod
of
sin
gle
el
ect
rode
e
xcita
ti
on
was
us
e
d.
First
el
ect
r
ode
(E
1)
beco
m
e
the
ex
ci
te
el
ect
ro
de
or
s
ource
el
ec
tro
de
w
hich
is
su
ppli
ed
by
a
sine
wa
ve,
w
hile
the
othe
r
three
el
ect
ro
des
will
act
as
a
receiv
er
.
T
hese
th
ree
el
ect
rodes
will
beco
m
e
gro
unde
d.
I
n
t
his
ti
m
e,
wh
e
n
el
ect
rode
1
was
i
nj
ect
e
d
by
the
s
ource
,
el
ect
ro
des
othe
r
tha
n
el
ect
r
ode
1
a
re
at
t
he
virt
ual
eart
h
po
te
ntial
i
m
posed
by
the
trans
du
ce
r
and
they
are
ca
ll
ed
the
detect
i
ng
el
ect
r
od
e
.
I
nd
e
pe
nd
e
nt
capaci
ta
nce
m
eas
ur
em
ents
wer
e
ta
ken
from
the
three
el
ect
ro
des
with
diff
e
ren
t
excit
at
ion
freq
ue
nc
y.
Th
e
fr
e
quen
cy
will
var
y
fr
om
50
Hz
to
9.
5MHz.
Fo
r
thes
e
case
s
,
the
re
a
re
3
in
dep
e
ndent
capaci
ta
nce
m
easur
em
ents
a
m
on
g
al
l
the
com
bin
at
ion
pa
irs
of
el
ect
ro
des
i.e E
1
-
E
2, E
1
-
E
3, a
nd E
1
-
E
4. The
data as s
how
n
i
n
Fi
gure
5
-
8.
Figure
5. Ca
pa
ci
ta
nce v
al
ue
f
or
gold
Evaluation Warning : The document was created with Spire.PDF for Python.
In
t J
Elec
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C
om
p
En
g
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88
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8708
Experime
nt st
udy
of usi
ng
pa
r
allel
p
late se
nsor f
or
the
detec
ti
on
of con
duct
iv
e m
ateri
al (N
. Lokm
anul
ha
k
im)
5633
Figure
6. Ca
pa
ci
ta
nce v
al
ue
f
or alum
iniu
m
Figure
7. Ca
pa
ci
ta
nce v
al
ue
f
or iron
Figure
8. Com
par
is
on of ca
pa
ci
ta
nce v
al
ue b
et
ween
pure
go
ld,
al
um
inium
and
ir
on
Evaluation Warning : The document was created with Spire.PDF for Python.
IS
S
N
:
2088
-
8708
In
t J
Elec
&
C
om
p
En
g,
V
ol.
9
, N
o.
6
,
Dece
m
ber
201
9
:
562
8
-
563
5
5634
As
s
how
n
i
n
the
res
pecti
ve
res
ults,
the
m
easur
ed
ca
pa
ci
ta
nce
is
ve
ry
sm
all
du
e
to
the
sm
all
el
ect
ro
des
.
T
he
resu
lt
m
igh
t
be
influ
e
nce
d
by
undesire
d
sta
nd
i
ng
ca
pacit
ance
f
ro
m
the
cable
an
d
surr
oundi
ng
ai
r.
By
com
par
ing
al
l
m
at
erials,
the
la
r
ger
ca
pacit
ance
was
pro
du
ce
d
by
th
e
pure g
ol
d
f
ol
lowe
d
by
al
umi
niu
m
and
i
ron.
This
can
be
relat
e
d
to
th
e
el
ect
r
ic
al
condu
ct
ivi
ty
of
the
m
at
e
rial
s.
The
gold
sta
te
is
the
hig
he
st
el
ect
rical
con
duct
ivit
y
(4
.
52x10
7
S/m
),
al
umi
niu
m
(3
.5x
10
7
S/m
)
and
iro
n
(
1.04x
10
7
S/
m
).
Be
side
s
that,
the
m
easur
em
e
nt
al
so
sli
ghtl
y
diff
e
re
nce
cau
sed
by
the
thic
kn
e
ss
of
the
m
at
erial
s.
From
the
obser
ve
d
r
esults,
the
value
m
easur
e
d
by
el
ect
rode
E1
-
E
2
was
fou
nd
to
pro
duce
the
highest
value
am
on
g
t
he
ot
her
com
bin
at
io
n
pairs o
f
el
ect
r
odes E
1
-
E3
and
E1
-
E4
.
4.
CONCL
US
I
O
N
AND
F
UT
U
RE W
ORK
As
s
umm
arize
d,
t
he
par
al
le
l
plate
sen
sor
i
s
capa
ble
to
use
f
or
ve
rifyi
ng
the
co
nducti
ve
m
at
erial
.
The
m
easur
em
ent
data
is
c
onsist
ent
f
or
ea
ch
el
ect
rode.
Howe
ver,
the
val
ue
of
c
apa
ci
ta
nce
is
too
sm
a
ll
.
Th
us
,
in
ste
ad
of
us
in
g
tra
diti
on
al
si
ng
le
el
e
ct
rode
excit
at
ion,
a
m
ulti
ple
-
el
ect
ro
de
e
xcita
ti
on
strat
e
gy
can
be
adopted
.
Mult
iple
el
ect
ro
de
s
will
excit
at
ion
sim
ultaneousl
y.
Fo
r
exam
ple,
a
2
el
ect
rode
se
nsor
c
an
be
i
m
ple
m
ented
by
com
bin
ing
the
el
ect
ro
de
E1
an
d
E3
.
W
it
h
m
ulti
ple
-
el
ect
rode
exc
it
at
ion
,
the
m
easur
e
d
capaci
ta
nce
is
three
ti
m
es
la
rg
er
th
an
si
ng
le
-
el
ect
rode
exci
ta
ti
on
[
28
]
.
Si
nce
this
ex
pe
rim
ent
is
in
the
early
sta
ges
th
us
s
om
e
sp
eci
fic
iss
ues
need
to
be
co
ns
ide
red.
Fi
rst
is
ab
out
th
e
eff
ect
ive
ness
of
the
se
ns
i
ng
area.
To
o
sm
al
l or
too
la
rg
e
sensi
ng area ca
n
ca
use
a too
high se
ns
it
ivit
y near
t
he
ed
ge or
t
oo
low
se
ns
it
ivit
y wil
l i
n
the
central
re
gi
on
will
produc
e
a
distor
ti
on.
Th
us
it
is
recom
m
e
nd
ed
to
se
t
the
le
ng
th
of
the
sh
ie
ldi
ng
l
ay
er
is
equ
al
t
o
the
wi
dth
of
t
he
se
nsi
ng
a
rea
a
nd
al
so
the
distance
betwee
n
the
t
wo
plate
s
[
29]
.
Seco
nd,
the
di
sta
nce
betwee
n
the
t
wo
plate
s.
In
t
heoreti
cal
ly
,
wh
en
t
he
distan
ce
is
cha
ng
e
d
it
will
aff
ect
the
se
ns
it
ivit
y.
In
t
his
exp
e
rim
ent,
the
distance
bet
ween
t
he
two
plate
s
is
sm
all
er
w
hich
is
go
od
f
or
se
ns
it
ivi
ty
in
the
centra
l
reg
io
n.
Howe
ver,
it
c
an
cause
t
he
plate
s
to
tou
c
h
the
m
at
erials.
This
is
bec
ause
each
m
ater
ia
l
hav
e
di
fferenc
e
thickne
ss
.
T
hus,
the
su
it
able
distance
nee
ds
to
stud
y
m
or
e.
Thir
d,
the
an
gle
betwee
n
th
e
two
plate
s.
I
n
so
m
e
case,
the
tw
o
plate
s
or
m
at
e
rial
te
ste
d
m
a
y
no
t
be
place
d
exactl
y
in
pa
rall
el
.
The
big
ge
st
issues
for
ECT
sens
or
is a
nu
m
ber
of
elec
tro
des
w
hich
it
de
te
rm
ines
the num
ber
o
f
im
ped
ance ca
pacit
a
nce.
T
he
hi
ghe
r
i
m
age
reso
l
ution
ca
n
be
pro
du
ce
d
by
the
la
r
ger
im
ped
a
nce
m
easu
rem
ent
.
But,
if
the
nu
m
ber
of
el
ect
rodes
i
nc
reases
then
it
will
cause
a
sm
al
le
r
sensing
ar
ea.
W
it
h
the
sm
al
l
sensing
a
rea,
the
m
easur
em
e
nt
is
dif
ficult
to
ta
ke
.
Th
us
,
t
he
be
st
num
ber
of
th
e
el
ect
rode
m
us
t
be
in
vestig
at
ed
rele
v
ant
with
m
at
erial
te
ste
d.
F
or
t
he
fu
t
ure
work,
w
rite
r
pro
pose
to
focu
s
on
the
relat
io
ns
hi
p
bet
ween
the
el
ect
rical
c
onduct
ivit
y
of
cond
uctive
m
a
te
rial
with the
v
al
ue of
capacit
ance
.
Th
e
o
t
her
s
pos
sible w
ork
ca
n be a
f
ocu
s
on t
he
im
age r
eco
nst
ru
ct
io
n.
ACKN
OWLE
DGME
NTS
Au
t
hors
are
grat
efu
l
to
t
he
fina
ncial
su
pport
by
PJ
P/2
018/FT
K
(
15
A)
/S
0164
1
an
d
U
niv
e
rsiti
Tek
nik
al
Ma
l
ay
sia
Me
la
ka
(
UTeM).
W
e
w
ou
l
d
li
ke
to
t
hank
ou
r
c
ollea
gu
e
s
from
the
Ce
nt
re
f
or
Tel
ecom
m
un
icati
on
Re
sea
rch
&
Inn
ov
at
io
n
(CeTR
I),
Un
i
ve
rsity
Te
knikal
Ma
la
ysi
a
Me
l
aka.
Tha
nks
t
o
sta
f
f
and
m
e
m
ber
s
of
UTeM
who
giv
e
as
sist
anc
e
an
d
com
m
i
t
m
ent
to
m
e
and
guid
e
m
e
in
var
i
ou
s
pe
rs
pe
ct
ive
thr
oughout
the
pro
j
ect
.
S
pecial
than
ks
m
us
t
be
gi
ve
n
to
m
y
fr
ie
nd
s
f
or
ideas
an
d
c
om
m
ent
reg
ar
din
g
to
m
y pr
oject
.
REFERE
NCE
S
[1]
K.
M.
B
l
y
th,
e
t
a
l
.
,
“
Anal
y
s
is of
Gold
Ores b
y
Fir
e
As
sa
y
,
”
J
.
Ch
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m.
Educ.
,
vol
.
81
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2004.
[2]
B.
C.
W
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Cort
i,
“
As
say
in
g
of
Gold
Jewel
r
y
—
Ancie
n
t
And
Modern,
”
St
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Fe
S
ymp.
Je
we
l
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Manuf
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chn
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Capora
li,
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l
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,
“
Dete
rm
inati
on
of
gold
in
al
lo
y
s
via
pote
n
ti
o
m
et
ric
ti
tr
ation;
an
al
ternat
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to
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A.
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al
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Applicati
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ene
rg
y
-
disper
sive
X
-
ra
y
fluor
esc
ence
to
je
we
l
le
r
y
sam
pl
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ini
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P.
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“
XRF
Anal
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si
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of
je
welr
y
using
fully
st
andardle
ss
funda
m
e
nta
l
p
ara
m
eter
appr
oac
h
,
”
Gol
d
Technol
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,
vo
l. 35
,
pp
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28
-
34
,
200
2.
[6]
K.
P
y
rz
y
ńsk
a,
“
Rec
ent
d
eve
lo
pm
ent
s
in
the
det
ermin
at
ion
of
gold
b
y
a
tomic
spec
trom
et
r
y
t
ec
hn
ique
s,
”
Spec
troch
im.
Acta
-
Part B
A
t. S
pec
trosc.
,
vo
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0,
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2005
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J.
Abdulla
h,
et
al
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,
“
Non
-
destru
ct
iv
e
assa
y
ing
gold
je
weller
y
us
ing
dual
-
en
erg
y
m
ic
ro
-
computed
tomograph
y
,
”
J.
Te
knol.
,
vol
.
7
3,
pp
.
25
-
28
,
20
15.
[8]
H.
As
hkena
ni
an
d
M.
Ali
,
“
Us
e
o
f
ionic
l
iqui
d
in
sim
ult
ane
ous
m
i
cro
ext
r
ac
t
ion
pr
oce
dure
for
d
et
e
rm
ina
ti
on
of
gol
d
and
silv
er
b
y
ETA
AS
,
”
Mic
roch
e
m.
J
.
,
vol. 103, p
p.
185
-
190
,
201
2.
[9]
S.
Tong,
et
al
.
,
“
Dete
rm
ina
ti
on
of
gold
(
III
)
and
pal
la
d
ium
(
II
)
in
m
ine
sa
m
ple
s
by
cl
oud
point
ext
racti
o
n
Evaluation Warning : The document was created with Spire.PDF for Python.
In
t J
Elec
&
C
om
p
En
g
IS
S
N:
20
88
-
8708
Experime
nt st
udy
of usi
ng
pa
r
allel
p
late se
nsor f
or
the
detec
ti
on
of con
duct
iv
e m
ateri
al (N
. Lokm
anul
ha
k
im)
5635
pre
concent
r
at
ion
coupled
wi
th
fl
a
m
e
at
om
ic a
bsor
pti
on
spe
ct
rom
etr
y
,
”
pp
.
95
-
102,
2011.
[10]
N.
Singh,
“
A
rugge
d,
pr
ec
ise
an
d
ac
cur
ate
new
gra
vimetr
y
m
et
h
od
for
the
d
eter
m
ina
ti
on
of
gold
:
an
a
lterna
t
ive
t
o
fire
assa
y
m
et
ho
d,
”
S
ingh
Spring
erPl
us
,
vo
l. 1, p
p.
1
-
6
,
2012
.
[11]
W
.
N.
Abd
Rashid
,
e
t
al
.
,
“
De
sign
Of
Non
D
estruc
t
ive
T
esting
On
Com
pos
it
e
Ma
te
ri
al
Us
i
ng
Para
llel
Pla
t
e
El
e
ct
ri
ca
l
Cap
acita
n
ce
Tomograp
h
y
:
A Conceptu
a
l
F
ramework
,
”
v
ol.
79(5
-
2
)
,
pp.
7
1
-
76,
2017
.
[12]
W
.
Norhis
y
am,
et
a
l
.
,
“
Deve
l
opm
ent
and
Ex
per
imental
Stud
y
of
Mini
at
ure
Two
-
pla
t
e
E
lect
ric
a
l
Cap
ac
i
ta
n
c
e
Sensor
to
Det
e
ct
Di
el
e
ct
ri
c
M
at
er
ia
l
,
”
Journal
of
Te
le
commu
nic
ati
on
,
El
e
ct
r
onic
and
Computer
Eng
ine
erin
g
(
JTEC
)
,
vol. 10,
pp.
5
-
10
.
[13]
W
.
N.
Abd
Rashid,
e
t
al
.
,
“
Design
of
non
-
destr
uct
iv
e
te
st
on
g
old
m
et
al
using
par
allel
p
la
t
e
c
a
pac
i
ta
nc
e
sensor
:
A c
once
p
tual
fr
a
m
ework,
”
R
es.
Dev
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(
SCOReD)
,
2016
IE
EE St
ud
ent
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,
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6
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[14]
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an
Norhis
y
am
Abd
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et
al
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,
“
Elec
tr
ic
a
l
c
apaci
t
a
nce
tomograph
y
:
a
rev
ie
w
on
po
rta
bl
e
ECT
s
y
ste
m
and
har
dwar
e
design,
”
in
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ensor R
evie
w
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.
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6(1),
pp
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[15]
Z.
Fan
and
R.
X.
Gao,
“
Enha
n
ce
m
ent
of
m
ea
surem
ent
eff
i
ci
en
c
y
for
el
e
ct
ri
cal
ca
pacit
anc
e
to
m
ogra
ph
y
,
”
IEEE
Tr
ans.
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Me
as.
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1708
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[16]
E.
J.
Moham
ad
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R.
A.
Rah
im,
“
Multi
phase
Flow
Rec
onstruct
ion
in
Oil
p
i
pel
in
es
b
y
Port
abl
e
Cap
acita
n
c
e
Tomograph
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”
S
ENSORS,
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I
EE
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27
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2010
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[17]
P.
W
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W
ang,
e
t
al
.
,
“
An
ECT
/
ERT
Dual
-
Modali
t
y
Senso
r
for
Oil
-
W
ater
Two
-
phase
Flo
w
Mea
surem
ent,”
AIP
Con
fe
ren
ce
Proce
ed
ings 1
59
2
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3
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[18]
H.
G.
W
ang
a
nd
W
.
Q.
Yang,
“
Mea
surem
ent
of
fl
uidi
sed
bed
dr
y
er
b
y
diffe
ren
t
fre
que
nc
y
and
diff
erent
norm
al
isat
ion
m
et
hods wit
h
elec
t
ric
a
l
c
apaci
t
ance
tomograph
y
,
”
P
owder
Technol.
,
vol.
199
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.
60
-
69,
2010
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[19]
A.
Hunt,
“
W
eighing
without
Touc
hing :
Appl
y
ing
E
lectr
i
ca
l
Capaci
t
ance
Tomograph
y
to
Mass
Flowrate
Mea
surem
ent
in M
ult
ipha
se
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,
”
SAGE
Journ
al
,
vo
l. 47, pp. 1
9
-
25,
2015
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[20]
W
.
Zha
ng
,
et
a
l
.
,
“
Applic
ation
of
el
e
ct
r
i
ca
l
c
apaci
t
anc
e
tomograph
y
in
p
art
i
culate
p
roc
ess
m
ea
sure
m
ent
–
A
rev
ie
w
,
”
Adv
.
Powd
er
Te
chnol
.
,
vo
l. 25, p
p.
174
-
188
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201
4.
[21]
A.
J.
Jawors
ki
and
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